Reference Date Title Language EN 62276:2005 2005-12-01 Single crystal wafers for surface acoustic wave (SAW) device appplications - Specifications and measuring methods     EN 60444-4:1997 1997-04-17 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz     EN 60679-5:1998 1998-08-07 Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval     EN 60862-1:2003 2003-08-29 Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification     EN 169100:1993 1993-05-15 Sectional Specification: Quartz crystal controlled oscillators (Capability approval)     EN 61837-3:2000 2000-11-30 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures     EN 168200:1993/A1:1993 1993-04-15 Sectional Specification: Quartz crystal units (Qualification approval)     EN 169201:1995 1995-07-28 Blank Detail Specification: Quartz crystal controlled oscillators (Qualification approval)     EN 61338-2:2004 2004-09-09 Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications     EN 60862-2:2002 2002-09-19 Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidance on use     EN 60368-4:2000 2000-12-21 Piezoelectric filters of assessed quality - Part 4: Sectional specification - Capability approval     EN 60444-6:1997 1997-04-17 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)     EN 168100:1993 1993-03-15 Sectional Specification: Quartz crystal units (Capability approval)     EN 61019-1:2005 2005-01-13 Surface acoustic wave (SAW) resonators - Part 1: Generic specification     EN 61338-1:2005 2005-01-17 Waveguide type dielectric resonators - Part 1: Generic specification     EN 61337-1:2004 2004-12-14 Filters using waveguide type dielectric resonators - Part 1: Generic specification     EN 61019-2:2005 2005-06-22 Surface acoustic wave (SAW) resonators - Part 2: Guide to the use     EN 61837-4:2004 2004-11-09 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines     EN 61338-4-1:2005 2005-05-19 Waveguide type dielectric resonators - Part 4-1: Blank detail specification     EN 61338-4:2005 2005-05-19 Waveguide type dielectric resonators - Part 4: Sectional specification     EN 60444-7:2004 2004-06-16 Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units     EN 60368-1:2000/A1:2004 2004-09-20 Piezoelectric filters of assessed quality - Part 1: Generic specification     EN 60444-9:2007 2007-04-12 Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units     EN 61338-1-4:2006 2006-02-03 Waveguide type dielectric resonators - Part 1-4: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency     EN 60679-1:2007 2007-06-06 Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification     EN 60862-3:2003 2003-12-19 Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines     EN 60122-1:2002 2002-12-10 Quartz crystal units of assessed quality - Part 1: Generic specification     EN 60444-8:2003 2003-10-14 Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units     EN 60679-4:1998 1998-02-20 Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional specification - Capability approval     EN 61338-1-3:2000 2000-03-22 Waveguide type dielectric resonators - Part 1-3: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at microwave frequency     EN 60368-4-1:2000 2000-12-21 Piezoelectric filters of assessed quality - Part 4-1: Blank detail specification - Capability approval     EN 60368-1:2000 2000-04-14 Piezoelectric filters of assessed quality - Part 1: Generic specification     EN 170100:2001 2001-08-07 Sectional Specification: Waveguide type dielectric resonators     EN 60679-4-1:1998 1998-04-23 Quartz crystal controlled oscillators of assessed quality - Part 4-1: Blank detail specification - Capability approval     EN 60679-5-1:1998 1998-08-07 Quartz crystal controlled oscillators of assessed quality - Part 5-1: Blank detail specification - Qualification approval     EN 61837-1:1999 1999-06-03 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines     EN 61837-2:2000 2000-11-30 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures     EN 60444-1:1997/A1:1999 1999-10-19 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network     EN 60368-3:2001 2001-10-23 Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections     EN 60679-3:2001 2001-10-24 Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections     EN 60122-3:2001 2001-10-19 Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections     EN 170101:2001 2001-08-07 Blank detail Specification: Waveguide type dielectric resonators - Capability approval     EN 60444-5:1997 1997-04-17 Measurement of quartz crystal unit parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction     EN 50324-2:2002 2002-05-31 Piezoelectric properties of ceramic materials and components - Part 2: Methods of measurement - Low power     EN 50324-3:2002 2002-05-31 Piezoelectric properties of ceramic materials and components - Part 3: Methods of measurement - High power     EN 60444-3:1997 1997-04-16 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 3: Basic method for the measurement of two-terminal parameters of quartz crystal units up to 200 MHz by phase technique in a pi-network with compensation of the parallel capacitance C0     EN 60444-2:1997 1997-04-16 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units     EN 60444-1:1997 1997-04-16 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network     EN 60368-2-2:1999 1999-02-12 Piezoelectric filters - Part 2: Guide to the use of piezoelectric filters - Section 2: Piezoelectric ceramic filters     EN 61240:1997 1997-03-10 Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules     EN 168201:1992 1992-05-15 Blank Detail Specification: Quartz crystal units (Qualification approval)     EN 169000:1992 1992-12-15 Generic Specification: Quartz crystal controlled oscillators     EN 168101:1992 1992-05-15 Blank Detail Specification: Quartz crystal units (Capability approval)     EN 168200:1993 1993-04-15 Sectional Specification: Quartz crystal units (Qualification approval)     EN 50324-1:2002 2002-05-31 Piezoelectric properties of ceramic materials and components - Part 1: Terms and definitions     EN 169101:1993 1993-02-01 Blank Detail Specification: Quartz crystal controlled oscillators (Capability approval)     EN 166100:1998 1998-08-18 Sectional Specification: Surface acoustic wave (SAW) filters     EN 166101:1999 1999-02-12 Blank Detail Specification: Surface Acoustic Wave (SAW) filters - Capability approval     EN 169000:1992/A1:1998 1998-02-12 Generic Specification: Quartz crystal controlled oscillators     EN 169200:1995 1995-07-28 Sectional Specification: Quartz crystal controlled oscillators (Qualification approval)     EN 61337-2:2004 2004-10-05 Filters using waveguide type dielectric resonators - Part 2: Guidance for use     EN 60679-6:2011 2011-04-22 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines     EN 60689:2009 2009-03-27 Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values     EN 60758:2009 2009-01-09 Synthetic quartz crystal - Specifications and guidelines for use     EN 60368-3:2010 2010-12-03 Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections     EN 60122-3:2010 2010-12-10 Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections     EN 62276:2013 2013-01-11 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods     EN 60444-11:2010 2010-11-05 Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction     EN 61837-2:2011 2011-07-08 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures     EN 62604-2:2012 2012-02-03 Surface Acoustic Wave (SAW) and Bulk Acoustic Wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use     EN 61837-1:2012 2012-08-17 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines     EN 60862-2:2012 2012-08-03 Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use     EN 62575-2:2012 2012-09-21 Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 2: Guidelines for the use     EN 61240:2012 2012-10-05 Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules