CENELEC
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
CLC/SR 47A |
Integrated circuits |
CLC/SR 47A Working Documents
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Reference,Title
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Closing date
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IEC parallel vote
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EN 61967-6:2002/prA1:2007 (pr=17129) Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method |
 EN |
2008-02-04 | Procedure Result | Yes | |
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EN 61967-6:2002/prA1:2005 (pr=17129) Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method |
EN |
2006-05-02 | Procedure Result | Yes | |
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FprEN 61967-8:2009 (pr=22743) Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method |
EN |
Procedure Result | Yes | ||
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FprEN 61967-8:2011 (pr=22743) Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method |
EN |
Procedure Result | Yes | ||
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FprEN 62132-2:2010 (pr=21926) Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method |
EN |
Procedure Result | Yes | ||
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FprEN 62132-2:2008 (pr=21926) Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method |
EN |
2008-11-24 | Procedure Result | Yes | |
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prEN 62132-3:2007 (pr=17166) Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 3: Bulk current injection (BCI) method |
EN |
2007-09-12 | Procedure Result | Yes | |
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prEN 62132-3:2005 (pr=17166) Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 3: Bulk current injection (BCI) method |
EN |
2006-06-16 | Procedure Result | Yes | |
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FprEN 62132-8:2012 (pr=23299) Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method |
EN |
Procedure Result | Yes | ||
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FprEN 62132-8:2011 (pr=23299) Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method |
EN |
Procedure Result | Yes | ||
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FprEN 62215-3:2012 (pr=24071) Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method |
EN |
Procedure Result | Yes | ||
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prEN 62433-2:2007 (pr=21163) EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE) |
EN |
2007-07-30 | Procedure Result | Yes | |
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FprEN 62433-2:2008 (pr=21163) EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE) |
EN |
2008-09-16 | Procedure Result | Yes |
CLC/SR 47A Documents open for vote
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Other Documents accessible to CLC/SR 47A
Reference,Title | Downloads |
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Definitive Text - EN 61967-4:2002/A1:2006 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method |  |
Definitive Text - EN 61967-4:2002/A1:2006 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method | |
Definitive Text - EN 61967-6:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method | |
Definitive Text - EN 61967-4:2002/A1:2006 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method | |
Definitive Text - EN 165000-1:1996 Film and hybrid integrated circuits - Part 1: Generic specification - Capability approval procedure | |
Definitive Text - EN 165000-2:1996 Film and hybrid integrated circuits - Part 2: Internal visual inspection and special tests | |
Definitive Text - EN 61967-2:2005 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method | |
Definitive Text - EN 61967-2:2005 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method | |
Definitive Text - EN 61967-2:2005 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method | |
Definitive Text - EN 62132-5:2006 Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 5: Workbench Faraday cage method | |
Definitive Text - EN 62132-5:2006 Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 5: Workbench Faraday cage method | |
Definitive Text - EN 62132-5:2006 Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 5: Workbench Faraday cage method | |
Definitive Text - EN 62132-1:2006 Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 1: General conditions and definitions | |
Definitive Text - EN 62132-1:2006 Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 1: General conditions and definitions | |
Definitive Text - EN 62132-1:2006 Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 1: General conditions and definitions | |
Definitive Text - EN 62132-4:2006 Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method | |
Definitive Text - EN 62132-4:2006 Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method | |
Definitive Text - EN 62132-4:2006 Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method | |
Definitive Text - EN 61967-8:2011 Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method | |
Definitive Text - EN 61967-8:2011 Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method | |
Definitive Text - EN 61967-8:2011 Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method | |
Definitive Text - EN 62132-3:2007 Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 3: Bulk current injection (BCI) method | |
Definitive Text - EN 62132-3:2007 Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 3: Bulk current injection (BCI) method | |
Definitive Text - EN 62132-3:2007 Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 3: Bulk current injection (BCI) method | |
Definitive Text - EN 61967-6:2002/A1:2008 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method | |
Definitive Text - EN 61967-6:2002/A1:2008 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method | |
Definitive Text - EN 61967-6:2002/A1:2008 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method | |
Definitive Text - EN 190116:1993 Family Specification: AC MOS Digital integrated circuits | |
Definitive Text - EN 61964:1999 Integrated circuits - Memory devices pin configurations | |
Definitive Text - EN 190103:1994 Family Specification: Digital integrated TTL low power Schottky circuits - Series 54LS, 64LS, 74LS, 84LS | |
Definitive Text - CECC 90 100:1985/AX:1987 SS: Digital monolithic integrated circuits (with A1 and A2) | |
Definitive Text - CECC 90 000:1990 Generic Specification: Monolithic integrated circuits (with annexes A, B, C, D, E and amendment A1) | |
Definitive Text - CECC 90 100:1985/AX:1988 SS: Digital monolithic integrated circuits (with A1 and A2) | |
Definitive Text - CECC 90 104:1990 Family Specification: C. MOS digital integrated circuits - Series 4000 B and 4000 UB (with A1) | |
Definitive Text - EN 165000-3:1996 Film and hybrid integrated circuits - Part 3: Self-audit checklist and report for film and hybrid integrated circuit manufacturers | |
Definitive Text - EN 165000-4:1996 Film and hybrid integrated circuits - Part 4: Customer information, product assessment level schedules and blank detail specification | |
Definitive Text - EN 190110:1994 Blank Detail Specification: Digital microprocessor integrated circuits | |
Definitive Text - ENV 190000-6:1993 Generic Specification: Monolithic integrated circuits - Procedure for approval and quality management | |
Definitive Text - EN 190101:1994 Family Specification: Digital integrated TTL circuits - Series 54, 64, 74, 84 | |
Definitive Text - EN 190102:1994 Family Specification: TTL-Schottky digital integrated circuits - Series 54S, 64S, 74S, 84S | |
Definitive Text - EN 190106:1994 Family Specification: TTL advanced low power Schottky digital integrated circuits - Series 54ALS, 74ALS | |
Definitive Text - EN 190107:1994 Family Specification: TTL FAST digital integrated circuits - Series 54F, 74F | |
Definitive Text - EN 190108:1994 Family Specification: TTL advanced Schottky digital integrated circuits - Series 54AS, 74AS | |
Definitive Text - EN 190109:1994 Family Specification: Digital integrated HC MOS circuits - Series HC/HCT/HCU | |
Definitive Text - CECC 90 302:1985 Blank Detail Specification: Integrated voltage comparators (with A1) | |
Definitive Text - CECC 290 001:1997 Technology Approval Schedule: Manufacture of microelectronic integrated circuits and ASICs | |
Definitive Text - EN 190100:1993 Sectional Specification: Digital monolithic integrated circuits | |
Definitive Text - EN 61967-4:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method | |
Definitive Text - EN 61943:1999 Integrated circuits - Manufacturing line approval application guideline | |
Definitive Text - EN 61967-5:2003 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions - Workbench Faraday Cage method | |
Definitive Text - EN 61967-1:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions | |
Definitive Text - CECC 90 203:1985 Blank Detail Specification: Integrated analogue switching circuits | |
Definitive Text - CECC 90 115:1993 Blank Detail Specification: Digital gate array integrated circuits | |
Definitive Text - CECC 90 114:1994 Blank Detail Specification: Programmable logic arrays (PLA) (with A1) | |
Definitive Text - CECC 90 202:1989 Blank Detail Specification: Integrated operational amplifiers (with A1) | |
Definitive Text - EN 190000:1995 Generic Specification: Monolithic integrated circuits | |
Definitive Text - CECC 90 300:1994 Sectional Specification: Interface monolithic integrated circuits (with A1) | |
Definitive Text - CECC 90 100:1985/AX:1990 SS: Digital monolithic integrated circuits (with A1 and A2) | |
Definitive Text - CECC 90 100:1985/AX:1990 SS: Digital monolithic integrated circuits (with A1 and A2) | |
Definitive Text - CECC 90 100:1985/AX:1989 SS: Digital monolithic integrated circuits (with A1 and A2) | |
Definitive Text - CECC 90 100:1985/AX:1989 SS: Digital monolithic integrated circuits (with A1 and A2) | |
Definitive Text - CECC 90 200:1987 Sectional Specification: Analogue monolithic integrated circuits (with A1) | |
Definitive Text - CECC 90 201:1988 Blank Detail Specification: Integrated voltage regulators (with A1) | |
Definitive Text - CECC 90 105:1986 Blank Detail Specification: Fusible link programmable bipolar read only memories, silicon monolithic integrated circuits (with A1 & A2) | |
Definitive Text - CECC 90 100:1985 SS: Digital monolithic integrated circuits (with A1 and A2) | |
Definitive Text - CECC 90 100:1985/AX:1985 SS: Digital monolithic integrated circuits (with A1 and A2) | |
Definitive Text - EN 62132-2:2011 Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method | |
Definitive Text - EN 62132-2:2011 Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method | |
Definitive Text - EN 62132-2:2011 Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method | |
Definitive Text - CECC 90 301:1985 Blank Detail Specification: Integrated line transmitters and/or receivers (with erratum and A1) | |
Definitive Text - CECC 90 111:1986 Blank Detail Specification: MOS read/write static memories silicon monolithic circuits (with A1) | |
Definitive Text - CECC 90 112:1986 Blank Detail Specification: MOS read/write dynamic memories silicon monolithic circuits (with A1) | |
Definitive Text - CECC 90 113:1986 Blank Detail Specification: MOS ultra-violet light erasable electrically programmable read only memories, silicon monolithic circuits (with A1) | |
Definitive Text - EN 61967-4:2002/A1:2006/corrigendum Dec. 2006 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method | |
Definitive Text - EN 61967-4:2002/A1:2006/corrigendum Dec. 2006 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method | |
Definitive Text - EN 61967-4:2002/A1:2006/corrigendum Dec. 2006 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method | |
Definitive Text - EN 62132-1:2006/corrigendum Nov. 2006 Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 1: General conditions and definitions | |
Definitive Text - EN 62132-1:2006/corrigendum Nov. 2006 Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 1: General conditions and definitions | |
Definitive Text - EN 62132-1:2006/corrigendum Nov. 2006 Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 1: General conditions and definitions | |
Definitive Text - EN 62132-8:2012 Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method | |
Definitive Text - EN 62132-8:2012 Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method | |
Definitive Text - EN 62132-8:2012 Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method | |
Definitive Text - EN 163100:1991 Sectional Specification: Film and hybrid integrated circuits | |
Definitive Text - EN 163101:1991 Blank Detail Specification: Film and hybrid integrated circuits | |
Definitive Text - EN 62433-2:2010 EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE) | |
Definitive Text - EN 62433-2:2010 EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE) | |
Definitive Text - EN 62433-2:2010 EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE) | |
