International Standards and Conformity Assessment for all electrical, electronic and related technologies

CLC/SR 47A

Integrated circuits

 
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CLC/SR 47A Working Documents

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EN 61967-6:2002/prA1:2007 (pr=17129)
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
export to doc file  EN 2008-02-04   Procedure Result Yes
EN 61967-6:2002/prA1:2005 (pr=17129)
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
export to doc file  EN 2006-05-02   Procedure Result Yes
FprEN 61967-8:2009 (pr=22743)
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
export to doc file  EN   Procedure Result Yes
FprEN 61967-8:2011 (pr=22743)
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
export to doc file  EN   Procedure Result Yes
FprEN 62132-2:2010 (pr=21926)
Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method
export to doc file  EN   Procedure Result Yes
FprEN 62132-2:2008 (pr=21926)
Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method
export to doc file  EN 2008-11-24   Procedure Result Yes
prEN 62132-3:2007 (pr=17166)
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 3: Bulk current injection (BCI) method
export to doc file  EN 2007-09-12   Procedure Result Yes
prEN 62132-3:2005 (pr=17166)
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 3: Bulk current injection (BCI) method
export to doc file  EN 2006-06-16   Procedure Result Yes
FprEN 62132-8:2011 (pr=23299)
Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method
export to doc file  EN   Procedure Result Yes
FprEN 62132-8:2012 (pr=23299)
Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method
export to doc file  EN   Procedure Result Yes
FprEN 62215-3:2012 (pr=24071)
Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method
export to doc file  EN   Procedure Result Yes
prEN 62433-2:2007 (pr=21163)
EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)
export to doc file  EN 2007-07-30   Procedure Result Yes
FprEN 62433-2:2008 (pr=21163)
EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)
export to doc file  EN 2008-09-16   Procedure Result Yes

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Other Documents accessible to CLC/SR 47A

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Definitive Text - EN 61967-4:2002/A1:2006
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
Definitive Text - EN 61967-4:2002/A1:2006
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
Definitive Text - EN 61967-6:2002
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
Definitive Text - EN 61967-4:2002/A1:2006
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
Definitive Text - EN 165000-1:1996
Film and hybrid integrated circuits - Part 1: Generic specification - Capability approval procedure
Definitive Text - EN 165000-2:1996
Film and hybrid integrated circuits - Part 2: Internal visual inspection and special tests
Definitive Text - EN 61967-2:2005
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
Definitive Text - EN 61967-2:2005
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
Definitive Text - EN 61967-2:2005
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
Definitive Text - EN 62132-5:2006
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 5: Workbench Faraday cage method
Definitive Text - EN 62132-5:2006
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 5: Workbench Faraday cage method
Definitive Text - EN 62132-5:2006
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 5: Workbench Faraday cage method
Definitive Text - EN 62132-1:2006
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 1: General conditions and definitions
Definitive Text - EN 62132-1:2006
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 1: General conditions and definitions
Definitive Text - EN 62132-1:2006
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 1: General conditions and definitions
Definitive Text - EN 62132-4:2006
Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method
Definitive Text - EN 62132-4:2006
Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method
Definitive Text - EN 62132-4:2006
Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method
Definitive Text - EN 61967-8:2011
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
Definitive Text - EN 61967-8:2011
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
Definitive Text - EN 61967-8:2011
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
Definitive Text - EN 62132-3:2007
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 3: Bulk current injection (BCI) method
Definitive Text - EN 62132-3:2007
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 3: Bulk current injection (BCI) method
Definitive Text - EN 62132-3:2007
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 3: Bulk current injection (BCI) method
Definitive Text - EN 61967-6:2002/A1:2008
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
Definitive Text - EN 61967-6:2002/A1:2008
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
Definitive Text - EN 61967-6:2002/A1:2008
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
Definitive Text - EN 190116:1993
Family Specification: AC MOS Digital integrated circuits
Definitive Text - EN 61964:1999
Integrated circuits - Memory devices pin configurations
Definitive Text - EN 190103:1994
Family Specification: Digital integrated TTL low power Schottky circuits - Series 54LS, 64LS, 74LS, 84LS
Definitive Text - CECC 90 100:1985/AX:1987
SS: Digital monolithic integrated circuits (with A1 and A2)
 
Definitive Text - CECC 90 000:1990
Generic Specification: Monolithic integrated circuits (with annexes A, B, C, D, E and amendment A1)
 
Definitive Text - CECC 90 100:1985/AX:1988
SS: Digital monolithic integrated circuits (with A1 and A2)
 
Definitive Text - CECC 90 104:1990
Family Specification: C. MOS digital integrated circuits - Series 4000 B and 4000 UB (with A1)
 
Definitive Text - EN 165000-3:1996
Film and hybrid integrated circuits - Part 3: Self-audit checklist and report for film and hybrid integrated circuit manufacturers
Definitive Text - EN 165000-4:1996
Film and hybrid integrated circuits - Part 4: Customer information, product assessment level schedules and blank detail specification
Definitive Text - EN 190110:1994
Blank Detail Specification: Digital microprocessor integrated circuits
Definitive Text - ENV 190000-6:1993
Generic Specification: Monolithic integrated circuits - Procedure for approval and quality management
 
Definitive Text - EN 190101:1994
Family Specification: Digital integrated TTL circuits - Series 54, 64, 74, 84
Definitive Text - EN 190102:1994
Family Specification: TTL-Schottky digital integrated circuits - Series 54S, 64S, 74S, 84S
Definitive Text - EN 190106:1994
Family Specification: TTL advanced low power Schottky digital integrated circuits - Series 54ALS, 74ALS
Definitive Text - EN 190107:1994
Family Specification: TTL FAST digital integrated circuits - Series 54F, 74F
Definitive Text - EN 190108:1994
Family Specification: TTL advanced Schottky digital integrated circuits - Series 54AS, 74AS
Definitive Text - EN 190109:1994
Family Specification: Digital integrated HC MOS circuits - Series HC/HCT/HCU
Definitive Text - CECC 90 302:1985
Blank Detail Specification: Integrated voltage comparators (with A1)
 
Definitive Text - CECC 290 001:1997
Technology Approval Schedule: Manufacture of microelectronic integrated circuits and ASICs
 
Definitive Text - EN 190100:1993
Sectional Specification: Digital monolithic integrated circuits
Definitive Text - EN 61967-4:2002
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
Definitive Text - EN 61943:1999
Integrated circuits - Manufacturing line approval application guideline
Definitive Text - EN 61967-5:2003
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions - Workbench Faraday Cage method
Definitive Text - EN 61967-1:2002
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
Definitive Text - CECC 90 203:1985
Blank Detail Specification: Integrated analogue switching circuits
 
Definitive Text - CECC 90 115:1993
Blank Detail Specification: Digital gate array integrated circuits
 
Definitive Text - CECC 90 114:1994
Blank Detail Specification: Programmable logic arrays (PLA) (with A1)
 
Definitive Text - CECC 90 202:1989
Blank Detail Specification: Integrated operational amplifiers (with A1)
 
Definitive Text - EN 190000:1995
Generic Specification: Monolithic integrated circuits
Definitive Text - CECC 90 300:1994
Sectional Specification: Interface monolithic integrated circuits (with A1)
 
Definitive Text - CECC 90 100:1985/AX:1990
SS: Digital monolithic integrated circuits (with A1 and A2)
 
Definitive Text - CECC 90 100:1985/AX:1990
SS: Digital monolithic integrated circuits (with A1 and A2)
 
Definitive Text - CECC 90 100:1985/AX:1989
SS: Digital monolithic integrated circuits (with A1 and A2)
 
Definitive Text - CECC 90 100:1985/AX:1989
SS: Digital monolithic integrated circuits (with A1 and A2)
 
Definitive Text - CECC 90 200:1987
Sectional Specification: Analogue monolithic integrated circuits (with A1)
 
Definitive Text - CECC 90 201:1988
Blank Detail Specification: Integrated voltage regulators (with A1)
 
Definitive Text - CECC 90 105:1986
Blank Detail Specification: Fusible link programmable bipolar read only memories, silicon monolithic integrated circuits (with A1 & A2)
 
Definitive Text - CECC 90 100:1985
SS: Digital monolithic integrated circuits (with A1 and A2)
 
Definitive Text - CECC 90 100:1985/AX:1985
SS: Digital monolithic integrated circuits (with A1 and A2)
 
Definitive Text - EN 62132-2:2011
Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method
Definitive Text - EN 62132-2:2011
Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method
Definitive Text - EN 62132-2:2011
Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method
Definitive Text - CECC 90 301:1985
Blank Detail Specification: Integrated line transmitters and/or receivers (with erratum and A1)
 
Definitive Text - CECC 90 111:1986
Blank Detail Specification: MOS read/write static memories silicon monolithic circuits (with A1)
 
Definitive Text - CECC 90 112:1986
Blank Detail Specification: MOS read/write dynamic memories silicon monolithic circuits (with A1)
 
Definitive Text - CECC 90 113:1986
Blank Detail Specification: MOS ultra-violet light erasable electrically programmable read only memories, silicon monolithic circuits (with A1)
 
Definitive Text - EN 61967-4:2002/A1:2006/corrigendum Dec. 2006
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
Definitive Text - EN 61967-4:2002/A1:2006/corrigendum Dec. 2006
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
Definitive Text - EN 61967-4:2002/A1:2006/corrigendum Dec. 2006
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
Definitive Text - EN 62132-1:2006/corrigendum Nov. 2006
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 1: General conditions and definitions
Definitive Text - EN 62132-1:2006/corrigendum Nov. 2006
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 1: General conditions and definitions
Definitive Text - EN 62132-1:2006/corrigendum Nov. 2006
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 1: General conditions and definitions
Definitive Text - EN 62215-3:2013
Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method
Definitive Text - EN 62215-3:2013
Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method
Definitive Text - EN 62215-3:2013
Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method
Definitive Text - EN 62132-8:2012
Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method
Definitive Text - EN 62132-8:2012
Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method
Definitive Text - EN 62132-8:2012
Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method
Definitive Text - EN 163100:1991
Sectional Specification: Film and hybrid integrated circuits
Definitive Text - EN 163101:1991
Blank Detail Specification: Film and hybrid integrated circuits
Definitive Text - EN 62433-2:2010
EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)
Definitive Text - EN 62433-2:2010
EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)
Definitive Text - EN 62433-2:2010
EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)

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