CENELEC
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
CLC/SR 49 |
Piezoelectric and dielectric devices for frequency control and selection |
CLC/SR 49 Working Documents
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Reference,Title
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Downloads
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Circulation date
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Closing date
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Voting / Comments
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IEC parallel vote
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FprEN 60122-3:2009 (pr=22692) Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections |
 EN |
Procedure Result | Yes | ||
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FprEN 60368-3:2009 (pr=22693) Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections |
EN |
Procedure Result | Yes | ||
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FprEN 60444-6:2012 (pr=24360) Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) |
EN |
Procedure Result | Yes | ||
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prEN 60444-9:2006 (pr=16925) Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units |
EN |
2007-02-07 | Procedure Result | Yes | |
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FprEN 60444-11:2009 (pr=22330) Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction |
EN |
Procedure Result | Yes | ||
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prEN 60679-1:2007 (pr=16906) Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification |
EN |
2007-03-26 | Procedure Result | Yes | |
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FprEN 60679-3:2011 (pr=23625) Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections |
EN |
Procedure Result | Yes | ||
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FprEN 60679-3:2012 (pr=23625) Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections |
EN |
Procedure Result | Yes | ||
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FprEN 60679-3:2011 (pr=23625) Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections |
EN |
Procedure Result | Yes | ||
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FprEN 60679-6:2008 (pr=22046) Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines |
EN |
2009-03-09 | Procedure Result | Yes | |
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FprEN 60679-6:2010 (pr=22046) Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines |
EN |
Procedure Result | Yes | ||
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FprEN 60689:2008 (pr=21475) Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values |
EN |
2008-11-04 | Procedure Result | Yes | |
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prEN 60689:2007 (pr=21475) Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values |
EN |
2008-01-28 | Procedure Result | Yes | |
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FprEN 60758:2008 (pr=21390) Synthetic quartz crystal - Specifications and guidelines for use |
EN |
2008-10-28 | Procedure Result | Yes | |
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prEN 60758:2007 (pr=21390) Synthetic quartz crystal - Specifications and guidelines for use |
EN |
2008-01-02 | Procedure Result | Yes | |
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FprEN 60862-2:2010 (pr=23260) Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use |
EN |
Procedure Result | Yes | ||
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FprEN 60862-2:2010 (pr=23260) Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use |
EN |
Procedure Result | Yes | ||
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FprEN 60862-2:2010 (pr=23260) Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use |
EN |
Procedure Result | Yes | ||
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FprEN 61240:2012 (pr=23282) Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules |
EN |
Procedure Result | Yes | ||
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FprEN 61240:2011 (pr=23282) Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules |
EN |
Procedure Result | Yes | ||
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FprEN 61837-1:2010 (pr=23253) Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines |
EN |
Procedure Result | Yes | ||
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FprEN 61837-1:2010 (pr=23253) Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines |
EN |
Procedure Result | Yes | ||
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FprEN 61837-2:2009 (pr=22678) Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures |
EN |
Procedure Result | Yes | ||
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FprEN 62276:2010 (pr=23153) Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods |
EN |
Procedure Result | Yes | ||
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FprEN 62276:2012 (pr=23153) Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods |
EN |
Procedure Result | Yes | ||
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FprEN 62575-2:2011 (pr=23386) Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 2: Guidelines for the use |
EN |
Procedure Result | Yes | ||
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FprEN 62575-2:2012 (pr=23386) Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 2: Guidelines for the use |
EN |
Procedure Result | Yes | ||
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FprEN 62604-2:2009 (pr=22691) Surface Acoustic Wave (SAW) and Bulk Acoustic Wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use |
EN |
2010-03-29 | Procedure Result | Yes | |
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FprEN 62604-2:2011 (pr=22691) Surface Acoustic Wave (SAW) and Bulk Acoustic Wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use |
EN |
Procedure Result | Yes | ||
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FprEN 62761:2012 (pr=24575) Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) |
EN |
Procedure Result | Yes |
CLC/SR 49 Documents open for vote
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Reference,Title
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Downloads
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Circulation date
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Closing date
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Type
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IEC parallel vote
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Other Documents accessible to CLC/SR 49
Reference,Title | Downloads |
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Definitive Text - EN 60679-1:1998/A2:2003 Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification | |
Definitive Text - EN 60444-4:1997 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz |  |
Definitive Text - EN 60679-5:1998 Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval | |
Definitive Text - CECC 69 000:1989/A1:1990 GS: Quartz crystal controlled oscillators (including capability approval) | |
Definitive Text - EN 169100:1993 Sectional Specification: Quartz crystal controlled oscillators (Capability approval) | |
Definitive Text - EN 60862-1:2003 Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification | |
Definitive Text - EN 61338-1-4:2006 Waveguide type dielectric resonators - Part 1-4: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency | |
Definitive Text - EN 61338-1-4:2006 Waveguide type dielectric resonators - Part 1-4: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency | |
Definitive Text - EN 61337-1:2004 Filters using waveguide type dielectric resonators - Part 1: Generic specification | |
Definitive Text - EN 61019-1:2005 Surface acoustic wave (SAW) resonators - Part 1: Generic specification | |
Definitive Text - EN 61019-1:2005 Surface acoustic wave (SAW) resonators - Part 1: Generic specification | |
Definitive Text - EN 61338-1:2005 Waveguide type dielectric resonators - Part 1: Generic specification | |
Definitive Text - EN 61338-1:2005 Waveguide type dielectric resonators - Part 1: Generic specification | |
Definitive Text - EN 60758:2005 Synthetic quartz crystal - Specifications and guide to the use | |
Definitive Text - EN 60758:2005 Synthetic quartz crystal - Specifications and guide to the use | |
Definitive Text - EN 61338-4:2005 Waveguide type dielectric resonators - Part 4: Sectional specification | |
Definitive Text - EN 61837-4:2004 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines | |
Definitive Text - EN 61338-4:2005 Waveguide type dielectric resonators - Part 4: Sectional specification | |
Definitive Text - EN 61019-2:2005 Surface acoustic wave (SAW) resonators - Part 2: Guide to the use | |
Definitive Text - EN 61019-2:2005 Surface acoustic wave (SAW) resonators - Part 2: Guide to the use | |
Definitive Text - EN 168200:1993/A1:1993 Sectional Specification: Quartz crystal units (Qualification approval) | |
Definitive Text - EN 169201:1995 Blank Detail Specification: Quartz crystal controlled oscillators (Qualification approval) | |
Definitive Text - CECC 68 000:1987 GS: Quartz Crystal Units (with A1) | |
Definitive Text - EN 60862-3:2003 Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines | |
Definitive Text - EN 60444-6:1997 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) | |
Definitive Text - EN 61837-3:2000 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures | |
Definitive Text - EN 61337-1-1:1997 Filters using waveguide type dielectric resonators - Part 1: General information, standard values and test conditions - Section 1: General information and standard values | |
Definitive Text - EN 167000:1993/A1:1997 Generic Specification: Piezoelectric filters | |
Definitive Text - EN 61338-2:2004 Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications | |
Definitive Text - EN 171000:2001 Generic specification: Filters using waveguide type dielectric resonators | |
Definitive Text - EN 60368-4:2000 Piezoelectric filters of assessed quality - Part 4: Sectional specification - Capability approval | |
Definitive Text - EN 61837-1:1999 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines | |
Definitive Text - EN 168100:1993 Sectional Specification: Quartz crystal units (Capability approval) | |
Definitive Text - EN 50324-2:2002 Piezoelectric properties of ceramic materials and components - Part 2: Methods of measurement - Low power | |
Definitive Text - EN 50324-3:2002 Piezoelectric properties of ceramic materials and components - Part 3: Methods of measurement - High power | |
Definitive Text - EN 61338-1-3:2000 Waveguide type dielectric resonators - Part 1-3: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at microwave frequency | |
Definitive Text - EN 170000:1999 Generic Specification: Waveguide type dielectric resonators | |
Definitive Text - EN 170100:2001 Sectional Specification: Waveguide type dielectric resonators | |
Definitive Text - EN 60679-5-1:1998 Quartz crystal controlled oscillators of assessed quality - Part 5-1: Blank detail specification - Qualification approval | |
Definitive Text - EN 60368-2-2:1999 Piezoelectric filters - Part 2: Guide to the use of piezoelectric filters - Section 2: Piezoelectric ceramic filters | |
Definitive Text - EN 61019-2:1997 Surface acoustic wave (SAW) resonators - Part 2: Guide to the use | |
Definitive Text - EN 60444-3:1997 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 3: Basic method for the measurement of two-terminal parameters of quartz crystal units up to 200 MHz by phase technique in a pi-network with compensation of the parallel capacitance C0 | |
Definitive Text - EN 60444-2:1997 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units | |
Definitive Text - EN 60444-1:1997 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network | |
Definitive Text - EN 60679-1:1998 Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification | |
Definitive Text - EN 168000:1993 Generic Specification: Quartz crystal units | |
Definitive Text - EN 168101:1992 Blank Detail Specification: Quartz crystal units (Capability approval) | |
Definitive Text - EN 168200:1993 Sectional Specification: Quartz crystal units (Qualification approval) | |
Definitive Text - EN 60679-4:1998 Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional specification - Capability approval | |
Definitive Text - EN 60444-5:1997 Measurement of quartz crystal unit parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction | |
Definitive Text - EN 168201:1992 Blank Detail Specification: Quartz crystal units (Qualification approval) | |
Definitive Text - EN 169000:1992 Generic Specification: Quartz crystal controlled oscillators | |
Definitive Text - EN 60368-4-1:2000 Piezoelectric filters of assessed quality - Part 4-1: Blank detail specification - Capability approval | |
Definitive Text - EN 60368-1:2000 Piezoelectric filters of assessed quality - Part 1: Generic specification | |
Definitive Text - EN 60679-1:1998/A1:2002 Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification | |
Definitive Text - EN 60444-8:2003 Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units | |
Definitive Text - EN 60444-8:2003 Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units | |
Definitive Text - EN 60444-8:2003 Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units | |
Definitive Text - EN 60122-1:2002 Quartz crystal units of assessed quality - Part 1: Generic specification | |
Definitive Text - EN 60444-1:1997/A1:1999 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network | |
Definitive Text - EN 170101:2001 Blank detail Specification: Waveguide type dielectric resonators - Capability approval | |
Definitive Text - EN 50324-1:2002 Piezoelectric properties of ceramic materials and components - Part 1: Terms and definitions | |
Definitive Text - CECC 68 200:1990 SS: Quartz crystal units - Qualification approval | |
Definitive Text - EN 61337-2:2004 Filters using waveguide type dielectric resonators - Part 2: Guidance for use | |
Definitive Text - CECC 68 100:1989 SS: Quartz Crystal Units - Capability approval (with A1 + erratum) | |
Definitive Text - CECC 68 100:1989/A1:1988 SS: Quartz Crystal Units - Capability approval (with A1 + erratum) | |
Definitive Text - EN 166000:1995 Generic Specification: Surface acoustic wave (SAW) filters | |
Definitive Text - EN 166100:1998 Sectional Specification: Surface acoustic wave (SAW) filters | |
Definitive Text - EN 166101:1999 Blank Detail Specification: Surface Acoustic Wave (SAW) filters - Capability approval | |
Definitive Text - CECC 69 000:1989 GS: Quartz crystal controlled oscillators (including capability approval) | |
Definitive Text - EN 169200:1995 Sectional Specification: Quartz crystal controlled oscillators (Qualification approval) | |
Definitive Text - EN 167100:1995 Sectional Specification: Piezoelectric filters (Capability approval) | |
Definitive Text - EN 167101:1995 Blank Detail Specification: Piezoelectric filters (Capability approval) | |
Definitive Text - CECC 68 000:1987/A1:1989 GS: Quartz Crystal Units (with A1) | |
Definitive Text - EN 168000:1993/A2:1998 Generic Specification: Quartz crystal units | |
Definitive Text - EN 167000:1993 Generic Specification: Piezoelectric filters | |
Definitive Text - EN 61338-4-1:2005 Waveguide type dielectric resonators - Part 4-1: Blank detail specification | |
Definitive Text - EN 60368-1:2000/A1:2004 Piezoelectric filters of assessed quality - Part 1: Generic specification | |
Definitive Text - EN 60368-1:2000/A1:2004 Piezoelectric filters of assessed quality - Part 1: Generic specification | |
Definitive Text - EN 60444-7:2004 Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units | |
Definitive Text - EN 60689:2009 Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values | |
Definitive Text - EN 60689:2009 Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values | |
Definitive Text - EN 60679-4-1:1998 Quartz crystal controlled oscillators of assessed quality - Part 4-1: Blank detail specification - Capability approval | |
Definitive Text - EN 169101:1993 Blank Detail Specification: Quartz crystal controlled oscillators (Capability approval) | |
Definitive Text - EN 169000:1992/A1:1998 Generic Specification: Quartz crystal controlled oscillators | |
Definitive Text - EN 60862-2:2012 Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use | |
Definitive Text - EN 60862-2:2012 Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use | |
Definitive Text - EN 60368-4-1:2000/corrigendum Feb. 2001 Piezoelectric filters of assessed quality - Part 4-1: Blank detail specification - Capability approval | |
Definitive Text - EN 60368-4-1:2000/corrigendum Feb. 2001 Piezoelectric filters of assessed quality - Part 4-1: Blank detail specification - Capability approval | |
Definitive Text - EN 60368-4-1:2000/corrigendum Feb. 2001 Piezoelectric filters of assessed quality - Part 4-1: Blank detail specification - Capability approval | |
Definitive Text - EN 60368-4:2000/corrigendum Feb. 2001 Piezoelectric filters of assessed quality - Part 4: Sectional specification - Capability approval | |
Definitive Text - EN 60368-4:2000/corrigendum Feb. 2001 Piezoelectric filters of assessed quality - Part 4: Sectional specification - Capability approval | |
Definitive Text - EN 60368-4:2000/corrigendum Feb. 2001 Piezoelectric filters of assessed quality - Part 4: Sectional specification - Capability approval | |
Definitive Text - EN 60368-1:2000/corrigendum Feb. 2001 Piezoelectric filters of assessed quality - Part 1: Generic specification | |
Definitive Text - EN 60368-1:2000/corrigendum Feb. 2001 Piezoelectric filters of assessed quality - Part 1: Generic specification | |
Definitive Text - EN 60368-1:2000/corrigendum Feb. 2001 Piezoelectric filters of assessed quality - Part 1: Generic specification | |
Definitive Text - EN 62276:2013 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods | |
Definitive Text - EN 62276:2013 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods | |
Definitive Text - EN 62276:2013 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods | |
Definitive Text - EN 60368-3:2001 Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections | |
Definitive Text - EN 60122-3:2001 Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections | |
Definitive Text - EN 61338-1-4:2006/corrigendum Nov. 2006 Waveguide type dielectric resonators - Part 1-4: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency | |
Definitive Text - EN 61338-1-4:2006/corrigendum Nov. 2006 Waveguide type dielectric resonators - Part 1-4: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency | |
Definitive Text - EN 61837-2:2000 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures | |
Definitive Text - EN 60122-3:2010 Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections | |
Definitive Text - EN 60122-3:2010 Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections | |
Definitive Text - EN 60122-3:2010 Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections | |
Definitive Text - EN 60368-3:2010 Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections | |
Definitive Text - EN 60368-3:2010 Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections | |
Definitive Text - EN 60368-3:2010 Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections | |
Definitive Text - EN 60444-11:2010 Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction | |
Definitive Text - EN 60444-11:2010 Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction | |
Definitive Text - EN 60444-11:2010 Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction | |
Definitive Text - EN 60444-9:2007 Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units | |
Definitive Text - EN 60444-9:2007 Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units | |
Definitive Text - EN 60444-9:2007 Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units | |
Definitive Text - EN 62604-2:2012 Surface Acoustic Wave (SAW) and Bulk Acoustic Wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use | |
Definitive Text - EN 62604-2:2012 Surface Acoustic Wave (SAW) and Bulk Acoustic Wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use | |
Definitive Text - EN 62604-2:2012 Surface Acoustic Wave (SAW) and Bulk Acoustic Wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use | |
Definitive Text - EN 61837-2:2011 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures | |
Definitive Text - EN 61837-2:2011 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures | |
Definitive Text - EN 61837-2:2011 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures | |
Definitive Text - EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines | |
Definitive Text - EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines | |
Definitive Text - EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines | |
Definitive Text - EN 61837-1:2012 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines | |
Definitive Text - EN 61837-1:2012 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines | |
Definitive Text - EN 61837-1:2012 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines | |
Definitive Text - EN 60862-2:2012 Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use | |
Definitive Text - EN 62276:2005 Single crystal wafers for surface acoustic wave (SAW) device appplications - Specifications and measuring methods | |
Definitive Text - EN 62276:2005 Single crystal wafers for surface acoustic wave (SAW) device appplications - Specifications and measuring methods | |
Definitive Text - EN 61338-4-1:2005 Waveguide type dielectric resonators - Part 4-1: Blank detail specification | |
Definitive Text - EN 61338-4-1:2005 Waveguide type dielectric resonators - Part 4-1: Blank detail specification | |
Definitive Text - EN 62575-2:2012 Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 2: Guidelines for the use | |
Definitive Text - EN 62575-2:2012 Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 2: Guidelines for the use | |
Definitive Text - EN 62575-2:2012 Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 2: Guidelines for the use | |
Definitive Text - EN 61240:2012 Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules | |
Definitive Text - EN 61240:2012 Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules | |
Definitive Text - EN 61240:2012 Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules | |
Definitive Text - EN 60758:2009 Synthetic quartz crystal - Specifications and guidelines for use | |
Definitive Text - EN 60758:2009 Synthetic quartz crystal - Specifications and guidelines for use | |
Definitive Text - EN 60758:2009 Synthetic quartz crystal - Specifications and guidelines for use | |
Definitive Text - EN 60444-7:2004 Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units | |
Definitive Text - EN 60862-2:2002 Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidance on use | |
Definitive Text - EN 61240:1997 Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules | |
Definitive Text - EN 60679-1:2007 Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification | |
Definitive Text - EN 60679-1:2007 Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification | |
Definitive Text - EN 60679-1:2007 Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification | |
Definitive Text - EN 60679-3:2001 Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections | |
