International Standards and Conformity Assessment for all electrical, electronic and related technologies

CLC/SR 49

Piezoelectric and dielectric devices for frequency control and selection

 
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CLC/SR 49 Working Documents

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FprEN 60122-3:2009 (pr=22692)
Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
export to doc file  EN   Procedure Result Yes
FprEN 60368-3:2009 (pr=22693)
Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections
export to doc file  EN   Procedure Result Yes
FprEN 60444-6:2012 (pr=24360)
Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
export to doc file  EN   Procedure Result Yes
prEN 60444-9:2006 (pr=16925)
Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units
export to doc file  EN 2007-02-07   Procedure Result Yes
FprEN 60444-11:2009 (pr=22330)
Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
export to doc file  EN   Procedure Result Yes
prEN 60679-1:2007 (pr=16906)
Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
export to doc file  EN 2007-03-26   Procedure Result Yes
FprEN 60679-3:2011 (pr=23625)
Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections
export to doc file  EN   Procedure Result Yes
FprEN 60679-3:2012 (pr=23625)
Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections
export to doc file  EN   Procedure Result Yes
FprEN 60679-3:2011 (pr=23625)
Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections
export to doc file  EN   Procedure Result Yes
FprEN 60679-6:2008 (pr=22046)
Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
export to doc file  EN 2009-03-09   Procedure Result Yes
FprEN 60679-6:2010 (pr=22046)
Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
export to doc file  EN   Procedure Result Yes
prEN 60689:2007 (pr=21475)
Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
export to doc file  EN 2008-01-28   Procedure Result Yes
FprEN 60689:2008 (pr=21475)
Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
export to doc file  EN 2008-11-04   Procedure Result Yes
FprEN 60758:2008 (pr=21390)
Synthetic quartz crystal - Specifications and guidelines for use
export to doc file  EN 2008-10-28   Procedure Result Yes
prEN 60758:2007 (pr=21390)
Synthetic quartz crystal - Specifications and guidelines for use
export to doc file  EN 2008-01-02   Procedure Result Yes
FprEN 60862-2:2010 (pr=23260)
Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use
export to doc file  EN   Procedure Result Yes
FprEN 60862-2:2010 (pr=23260)
Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use
export to doc file  EN   Procedure Result Yes
FprEN 60862-2:2010 (pr=23260)
Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use
export to doc file  EN   Procedure Result Yes
FprEN 61240:2011 (pr=23282)
Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules
export to doc file  EN   Procedure Result Yes
FprEN 61240:2012 (pr=23282)
Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules
export to doc file  EN   Procedure Result Yes
FprEN 61837-1:2010 (pr=23253)
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines
export to doc file  EN   Procedure Result Yes
FprEN 61837-1:2010 (pr=23253)
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines
export to doc file  EN   Procedure Result Yes
FprEN 61837-2:2009 (pr=22678)
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
export to doc file  EN   Procedure Result Yes
EN 61837-2:2011/FprA1:2013 (pr=24933)
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
export to doc file  EN   Procedure Result Yes
FprEN 61837-3:2013 (pr=24970)
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosure
export to doc file  EN   Procedure Result Yes
FprEN 61837-4:2013 (pr=24971)
Surface mounted piezoelectric devices for frequency control and selection - Standard outline and terminal lead connections - Part 4: Hybrid enclosure outline
export to doc file  EN   Procedure Result Yes
FprEN 62276:2010 (pr=23153)
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
export to doc file  EN   Procedure Result Yes
FprEN 62276:2012 (pr=23153)
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
export to doc file  EN   Procedure Result Yes
FprEN 62575-2:2011 (pr=23386)
Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 2: Guidelines for the use
export to doc file  EN   Procedure Result Yes
FprEN 62575-2:2012 (pr=23386)
Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 2: Guidelines for the use
export to doc file  EN   Procedure Result Yes
FprEN 62604-2:2011 (pr=22691)
Surface Acoustic Wave (SAW) and Bulk Acoustic Wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use
export to doc file  EN   Procedure Result Yes
FprEN 62604-2:2009 (pr=22691)
Surface Acoustic Wave (SAW) and Bulk Acoustic Wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use
export to doc file  EN 2010-03-29   Procedure Result Yes
FprEN 62761:2012 (pr=24575)
Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF)
export to doc file  EN   Procedure Result Yes
FprEN 62761:2013 (pr=24575)
Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF)
export to doc file  EN   Procedure Result Yes

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CLC/SR 49 Documents open for vote

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Other Documents accessible to CLC/SR 49

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Definitive Text - EN 60679-1:1998/A2:2003
Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
Definitive Text - EN 60444-4:1997
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz
Definitive Text - CECC 69 000:1989/A1:1990
GS: Quartz crystal controlled oscillators (including capability approval)
 
Definitive Text - EN 60862-1:2003
Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification
Definitive Text - EN 61338-1-4:2006
Waveguide type dielectric resonators - Part 1-4: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency
Definitive Text - EN 61338-1-4:2006
Waveguide type dielectric resonators - Part 1-4: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency
Definitive Text - EN 60758:2005
Synthetic quartz crystal - Specifications and guide to the use
Definitive Text - EN 60758:2005
Synthetic quartz crystal - Specifications and guide to the use
Definitive Text - EN 61338-4:2005
Waveguide type dielectric resonators - Part 4: Sectional specification
Definitive Text - EN 61338-4:2005
Waveguide type dielectric resonators - Part 4: Sectional specification
Definitive Text - EN 61019-2:2005
Surface acoustic wave (SAW) resonators - Part 2: Guide to the use
Definitive Text - EN 61019-2:2005
Surface acoustic wave (SAW) resonators - Part 2: Guide to the use
Definitive Text - EN 168200:1993/A1:1993
Sectional Specification: Quartz crystal units (Qualification approval)
Definitive Text - CECC 68 000:1987
GS: Quartz Crystal Units (with A1)
 
Definitive Text - EN 60862-3:2003
Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines
Definitive Text - EN 61837-3:2000
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures
Definitive Text - EN 61337-1-1:1997
Filters using waveguide type dielectric resonators - Part 1: General information, standard values and test conditions - Section 1: General information and standard values
 
Definitive Text - EN 167000:1993/A1:1997
Generic Specification: Piezoelectric filters
 
Definitive Text - EN 61338-2:2004
Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications
Definitive Text - EN 171000:2001
Generic specification: Filters using waveguide type dielectric resonators
Definitive Text - EN 60368-4:2000
Piezoelectric filters of assessed quality - Part 4: Sectional specification - Capability approval
Definitive Text - EN 61837-1:1999
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines
 
Definitive Text - EN 168100:1993
Sectional Specification: Quartz crystal units (Capability approval)
Definitive Text - EN 50324-2:2002
Piezoelectric properties of ceramic materials and components - Part 2: Methods of measurement - Low power
Definitive Text - EN 50324-3:2002
Piezoelectric properties of ceramic materials and components - Part 3: Methods of measurement - High power
Definitive Text - EN 61338-1-3:2000
Waveguide type dielectric resonators - Part 1-3: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at microwave frequency
Definitive Text - EN 170000:1999
Generic Specification: Waveguide type dielectric resonators
Definitive Text - EN 60368-2-2:1999
Piezoelectric filters - Part 2: Guide to the use of piezoelectric filters - Section 2: Piezoelectric ceramic filters
Definitive Text - EN 61019-2:1997
Surface acoustic wave (SAW) resonators - Part 2: Guide to the use
 
Definitive Text - EN 60444-3:1997
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 3: Basic method for the measurement of two-terminal parameters of quartz crystal units up to 200 MHz by phase technique in a pi-network with compensation of the parallel capacitance C0
Definitive Text - EN 60444-2:1997
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
Definitive Text - EN 60444-1:1997
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network
Definitive Text - EN 168000:1993
Generic Specification: Quartz crystal units
 
Definitive Text - EN 168200:1993
Sectional Specification: Quartz crystal units (Qualification approval)
Definitive Text - EN 60444-5:1997
Measurement of quartz crystal unit parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction
Definitive Text - EN 60368-4-1:2000
Piezoelectric filters of assessed quality - Part 4-1: Blank detail specification - Capability approval
Definitive Text - EN 60368-1:2000
Piezoelectric filters of assessed quality - Part 1: Generic specification
Definitive Text - EN 60679-1:1998/A1:2002
Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
Definitive Text - EN 60444-8:2003
Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units
Definitive Text - EN 60444-8:2003
Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units
Definitive Text - EN 60444-8:2003
Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units
Definitive Text - EN 60122-1:2002
Quartz crystal units of assessed quality - Part 1: Generic specification
Definitive Text - EN 60444-1:1997/A1:1999
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network
Definitive Text - EN 50324-1:2002
Piezoelectric properties of ceramic materials and components - Part 1: Terms and definitions
Definitive Text - CECC 68 200:1990
SS: Quartz crystal units - Qualification approval
 
Definitive Text - EN 61337-2:2004
Filters using waveguide type dielectric resonators - Part 2: Guidance for use
Definitive Text - CECC 68 100:1989
SS: Quartz Crystal Units - Capability approval (with A1 + erratum)
 
Definitive Text - CECC 68 100:1989/A1:1988
SS: Quartz Crystal Units - Capability approval (with A1 + erratum)
 
Definitive Text - EN 166000:1995
Generic Specification: Surface acoustic wave (SAW) filters
Definitive Text - CECC 69 000:1989
GS: Quartz crystal controlled oscillators (including capability approval)
 
Definitive Text - EN 167100:1995
Sectional Specification: Piezoelectric filters (Capability approval)
 
Definitive Text - EN 167101:1995
Blank Detail Specification: Piezoelectric filters (Capability approval)
 
Definitive Text - CECC 68 000:1987/A1:1989
GS: Quartz Crystal Units (with A1)
 
Definitive Text - EN 168000:1993/A2:1998
Generic Specification: Quartz crystal units
Definitive Text - EN 167000:1993
Generic Specification: Piezoelectric filters
 
Definitive Text - EN 61338-4-1:2005
Waveguide type dielectric resonators - Part 4-1: Blank detail specification
Definitive Text - EN 60368-1:2000/A1:2004
Piezoelectric filters of assessed quality - Part 1: Generic specification
Definitive Text - EN 60368-1:2000/A1:2004
Piezoelectric filters of assessed quality - Part 1: Generic specification
Definitive Text - EN 60862-2:2012
Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use
Definitive Text - EN 60862-2:2012
Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use
Definitive Text - EN 60368-4-1:2000/corrigendum Feb. 2001
Piezoelectric filters of assessed quality - Part 4-1: Blank detail specification - Capability approval
Definitive Text - EN 60368-4-1:2000/corrigendum Feb. 2001
Piezoelectric filters of assessed quality - Part 4-1: Blank detail specification - Capability approval
Definitive Text - EN 60368-4-1:2000/corrigendum Feb. 2001
Piezoelectric filters of assessed quality - Part 4-1: Blank detail specification - Capability approval
Definitive Text - EN 60368-4:2000/corrigendum Feb. 2001
Piezoelectric filters of assessed quality - Part 4: Sectional specification - Capability approval
Definitive Text - EN 60368-4:2000/corrigendum Feb. 2001
Piezoelectric filters of assessed quality - Part 4: Sectional specification - Capability approval
Definitive Text - EN 60368-4:2000/corrigendum Feb. 2001
Piezoelectric filters of assessed quality - Part 4: Sectional specification - Capability approval
Definitive Text - EN 60368-1:2000/corrigendum Feb. 2001
Piezoelectric filters of assessed quality - Part 1: Generic specification
Definitive Text - EN 60368-1:2000/corrigendum Feb. 2001
Piezoelectric filters of assessed quality - Part 1: Generic specification
Definitive Text - EN 60368-1:2000/corrigendum Feb. 2001
Piezoelectric filters of assessed quality - Part 1: Generic specification
Definitive Text - EN 62276:2013
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
Definitive Text - EN 62276:2013
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
Definitive Text - EN 62276:2013
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
Definitive Text - EN 60368-3:2001
Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections
Definitive Text - EN 60122-3:2001
Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
Definitive Text - EN 61338-1-4:2006/corrigendum Nov. 2006
Waveguide type dielectric resonators - Part 1-4: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency
Definitive Text - EN 61338-1-4:2006/corrigendum Nov. 2006
Waveguide type dielectric resonators - Part 1-4: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency
Definitive Text - EN 170100:2001
Sectional Specification: Waveguide type dielectric resonators
Definitive Text - EN 170100:2001
Sectional Specification: Waveguide type dielectric resonators
Definitive Text - EN 61837-2:2000
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
Definitive Text - EN 60122-3:2010
Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
Definitive Text - EN 60122-3:2010
Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
Definitive Text - EN 60122-3:2010
Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
Definitive Text - EN 60368-3:2010
Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections
Definitive Text - EN 60368-3:2010
Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections
Definitive Text - EN 60368-3:2010
Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections
Definitive Text - EN 60444-11:2010
Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
Definitive Text - EN 60444-11:2010
Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
Definitive Text - EN 60444-11:2010
Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
Definitive Text - EN 62604-2:2012
Surface Acoustic Wave (SAW) and Bulk Acoustic Wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use
Definitive Text - EN 62604-2:2012
Surface Acoustic Wave (SAW) and Bulk Acoustic Wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use
Definitive Text - EN 62604-2:2012
Surface Acoustic Wave (SAW) and Bulk Acoustic Wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use
Definitive Text - EN 61837-2:2011
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
Definitive Text - EN 61837-2:2011
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
Definitive Text - EN 61837-2:2011
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
Definitive Text - EN 60679-6:2011
Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
Definitive Text - EN 60679-6:2011
Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
Definitive Text - EN 60679-6:2011
Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
Definitive Text - EN 61837-1:2012
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines
Definitive Text - EN 61837-1:2012
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines
Definitive Text - EN 61837-1:2012
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines
Definitive Text - EN 60862-2:2012
Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use
Definitive Text - EN 62276:2005
Single crystal wafers for surface acoustic wave (SAW) device appplications - Specifications and measuring methods
Definitive Text - EN 62276:2005
Single crystal wafers for surface acoustic wave (SAW) device appplications - Specifications and measuring methods
Definitive Text - EN 61338-4-1:2005
Waveguide type dielectric resonators - Part 4-1: Blank detail specification
Definitive Text - EN 61338-4-1:2005
Waveguide type dielectric resonators - Part 4-1: Blank detail specification
Definitive Text - EN 62575-2:2012
Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 2: Guidelines for the use
Definitive Text - EN 62575-2:2012
Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 2: Guidelines for the use
Definitive Text - EN 62575-2:2012
Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 2: Guidelines for the use
Definitive Text - EN 61240:2012
Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules
Definitive Text - EN 61240:2012
Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules
Definitive Text - EN 61240:2012
Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules
Definitive Text - EN 60758:2009
Synthetic quartz crystal - Specifications and guidelines for use
Definitive Text - EN 60758:2009
Synthetic quartz crystal - Specifications and guidelines for use
Definitive Text - EN 60758:2009
Synthetic quartz crystal - Specifications and guidelines for use
Definitive Text - EN 60862-2:2002
Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidance on use
Definitive Text - EN 61240:1997
Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules
 
Definitive Text - EN 61019-1:2005
Surface acoustic wave (SAW) resonators - Part 1: Generic specification
Definitive Text - EN 61019-1:2005
Surface acoustic wave (SAW) resonators - Part 1: Generic specification
Definitive Text - EN 61019-1:2005
Surface acoustic wave (SAW) resonators - Part 1: Generic specification
Definitive Text - EN 61837-4:2004
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines
Definitive Text - EN 61837-4:2004
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines
Definitive Text - EN 60679-3:2013
Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections
Definitive Text - EN 60679-3:2013
Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections
Definitive Text - EN 60679-3:2013
Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections
Definitive Text - EN 60679-3:2001
Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections
Definitive Text - EN 60679-1:2007
Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
Definitive Text - EN 60679-1:2007
Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
Definitive Text - EN 60679-1:2007
Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
Definitive Text - EN 169101:1993
Blank Detail Specification: Quartz crystal controlled oscillators (Capability approval)
Definitive Text - EN 60679-5:1998
Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval
Definitive Text - EN 60679-5-1:1998
Quartz crystal controlled oscillators of assessed quality - Part 5-1: Blank detail specification - Qualification approval
Definitive Text - EN 169201:1995
Blank Detail Specification: Quartz crystal controlled oscillators (Qualification approval)
Definitive Text - EN 168101:1992
Blank Detail Specification: Quartz crystal units (Capability approval)
Definitive Text - EN 168101:1992
Blank Detail Specification: Quartz crystal units (Capability approval)
Definitive Text - EN 168201:1992
Blank Detail Specification: Quartz crystal units (Qualification approval)
Definitive Text - EN 168201:1992
Blank Detail Specification: Quartz crystal units (Qualification approval)
Definitive Text - EN 170101:2001
Blank detail Specification: Waveguide type dielectric resonators - Capability approval
Definitive Text - EN 170101:2001
Blank detail Specification: Waveguide type dielectric resonators - Capability approval
Definitive Text - EN 61338-1:2005
Waveguide type dielectric resonators - Part 1: Generic specification
Definitive Text - EN 61338-1:2005
Waveguide type dielectric resonators - Part 1: Generic specification
Definitive Text - EN 61337-1:2004
Filters using waveguide type dielectric resonators - Part 1: Generic specification
Definitive Text - EN 60689:2009
Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
Definitive Text - EN 60689:2009
Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
Definitive Text - EN 60689:2009
Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
Definitive Text - EN 61337-1:2004
Filters using waveguide type dielectric resonators - Part 1: Generic specification
Definitive Text - EN 61338-1:2005
Waveguide type dielectric resonators - Part 1: Generic specification
Definitive Text - EN 166100:1998
Sectional Specification: Surface acoustic wave (SAW) filters
Definitive Text - EN 166100:1998
Sectional Specification: Surface acoustic wave (SAW) filters
Definitive Text - EN 60444-6:2013
Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
Definitive Text - EN 60444-6:2013
Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
Definitive Text - EN 60444-6:2013
Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
Definitive Text - EN 60444-6:1997
Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
Definitive Text - EN 166100:1998
Sectional Specification: Surface acoustic wave (SAW) filters
Definitive Text - EN 60444-7:2004
Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units
Definitive Text - EN 60444-7:2004
Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units
Definitive Text - EN 166101:1999
Blank Detail Specification: Surface Acoustic Wave (SAW) filters - Capability approval
Definitive Text - EN 166101:1999
Blank Detail Specification: Surface Acoustic Wave (SAW) filters - Capability approval
Definitive Text - EN 60679-4-1:1998
Quartz crystal controlled oscillators of assessed quality - Part 4-1: Blank detail specification - Capability approval
Definitive Text - EN 169200:1995
Sectional Specification: Quartz crystal controlled oscillators (Qualification approval)
Definitive Text - EN 60679-1:1998
Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
Definitive Text - EN 60679-4:1998
Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional specification - Capability approval
Definitive Text - EN 169100:1993
Sectional Specification: Quartz crystal controlled oscillators (Capability approval)
Definitive Text - EN 169000:1992
Generic Specification: Quartz crystal controlled oscillators
Definitive Text - EN 169000:1992/A1:1998
Generic Specification: Quartz crystal controlled oscillators
Definitive Text - EN 60444-9:2007
Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units
Definitive Text - EN 60444-9:2007
Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units
Definitive Text - EN 60444-9:2007
Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units

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