CENELEC - Standards Development - List of Technical Bodies - CLC/SR 47A

CLC/SR 47A

Integrated circuits

 
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CLC/SR 47A Work programme

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FprEN 62132-1:2014 (pr=25229)
Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
5020  2013-12-062014-01-312014-05-02 

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CLC/SR 47A Publications

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CECC 290 001:1997 (pr=8291)
Technology Approval Schedule: Manufacture of microelectronic integrated circuits and ASICs
1997-02-04  
CECC 90 104:1990 (pr=1316)
Family Specification: C. MOS digital integrated circuits - Series 4000 B and 4000 UB (with A1)
1990-01-01  
CECC 90 105:1986 (pr=1347)
Blank Detail Specification: Fusible link programmable bipolar read only memories, silicon monolithic integrated circuits (with A1 & A2)
1986-01-01  
CECC 90 114:1994 (pr=1555)
Blank Detail Specification: Programmable logic arrays (PLA) (with A1)
1994-07-15  
CECC 90 115:1993 (pr=1558)
Blank Detail Specification: Digital gate array integrated circuits
1993-12-15  
CECC 90 200:1987 (pr=1303)
Sectional Specification: Analogue monolithic integrated circuits (with A1)
1987-01-01  
CECC 90 201:1988 (pr=1317)
Blank Detail Specification: Integrated voltage regulators (with A1)
1988-01-01  
CECC 90 202:1989 (pr=1406)
Blank Detail Specification: Integrated operational amplifiers (with A1)
1989-01-01  
CECC 90 203:1985 (pr=6620)
Blank Detail Specification: Integrated analogue switching circuits
1985-12-15  
CECC 90 300:1994 (pr=1403)
Sectional Specification: Interface monolithic integrated circuits (with A1)
1994-09-15  
CECC 90 302:1985 (pr=6621)
Blank Detail Specification: Integrated voltage comparators (with A1)
1985-12-15  
EN 163100:1991 (pr=6115)
Sectional Specification: Film and hybrid integrated circuits
1991-12-15 export to doc file  EN
EN 163101:1991 (pr=6116)
Blank Detail Specification: Film and hybrid integrated circuits
1991-12-15 export to doc file  EN
EN 165000-1:1996 (pr=1328)
Film and hybrid integrated circuits - Part 1: Generic specification - Capability approval procedure
1996-04-16 export to doc file  EN
EN 165000-2:1996 (pr=7574)
Film and hybrid integrated circuits - Part 2: Internal visual inspection and special tests
1996-04-16 export to doc file  EN
EN 165000-3:1996 (pr=7575)
Film and hybrid integrated circuits - Part 3: Self-audit checklist and report for film and hybrid integrated circuit manufacturers
1996-04-17 export to doc file  EN
EN 165000-4:1996 (pr=7576)
Film and hybrid integrated circuits - Part 4: Customer information, product assessment level schedules and blank detail specification
1996-04-17 export to doc file  EN
EN 190000:1995 (pr=1417)
Generic Specification: Monolithic integrated circuits
1995-06-21 export to doc file  EN
EN 190100:1993 (pr=6134)
Sectional Specification: Digital monolithic integrated circuits
1993-04-15 export to doc file  EN
EN 190101:1994 (pr=5460)
Family Specification: Digital integrated TTL circuits - Series 54, 64, 74, 84
1994-05-15 export to doc file  EN
EN 190102:1994 (pr=5461)
Family Specification: TTL-Schottky digital integrated circuits - Series 54S, 64S, 74S, 84S
1994-05-15 export to doc file  EN
EN 190103:1994 (pr=5462)
Family Specification: Digital integrated TTL low power Schottky circuits - Series 54LS, 64LS, 74LS, 84LS
1994-05-15 export to doc file  EN
EN 190106:1994 (pr=5463)
Family Specification: TTL advanced low power Schottky digital integrated circuits - Series 54ALS, 74ALS
1994-05-15 export to doc file  EN
EN 190107:1994 (pr=5464)
Family Specification: TTL FAST digital integrated circuits - Series 54F, 74F
1994-05-15 export to doc file  EN
EN 190108:1994 (pr=5465)
Family Specification: TTL advanced Schottky digital integrated circuits - Series 54AS, 74AS
1994-05-15 export to doc file  EN
EN 190109:1994 (pr=5466)
Family Specification: Digital integrated HC MOS circuits - Series HC/HCT/HCU
1994-05-15 export to doc file  EN
EN 190110:1994 (pr=5778)
Blank Detail Specification: Digital microprocessor integrated circuits
1994-05-15 export to doc file  EN
EN 190116:1993 (pr=1301)
Family Specification: AC MOS Digital integrated circuits
1993-08-15 export to doc file  EN
EN 61943:1999 (pr=12898)
Integrated circuits - Manufacturing line approval application guideline
1999-08-09 export to doc file  EN
EN 61964:1999 (pr=12934)
Integrated circuits - Memory devices pin configurations
1999-05-31 export to doc file  EN
EN 61967-1:2002 (pr=13700)
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
2002-06-05 export to doc file  EN
EN 61967-2:2005 (pr=16243)
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
2005-10-25 export to doc file  EN  FR  DE
EN 61967-4:2002 (pr=14191)
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
2002-06-14 export to doc file  EN
EN 61967-4:2002/A1:2006 (pr=16202)
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
2006-02-28 export to doc file  EN  FR  DE
EN 61967-5:2003 (pr=14508)
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions - Workbench Faraday Cage method
2003-04-23 export to doc file  EN
EN 61967-6:2002 (pr=14186)
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
2002-10-08 export to doc file  EN
EN 61967-6:2002/A1:2008 (pr=17129)
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
2008-05-14 export to doc file  EN  FR  DE
EN 61967-8:2011 (pr=22743)
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
2011-10-14 export to doc file  EN  FR  DE
EN 62132-1:2006 (pr=16169)
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 1: General conditions and definitions
2006-02-10 export to doc file  EN  FR  DE
EN 62132-2:2011 (pr=21926)
Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method
2011-03-04 export to doc file  EN  FR  DE
EN 62132-3:2007 (pr=17166)
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 3: Bulk current injection (BCI) method
2007-10-10 export to doc file  EN  FR  DE
EN 62132-4:2006 (pr=16170)
Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method
2006-05-19 export to doc file  EN  FR  DE
EN 62132-5:2006 (pr=16128)
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 5: Workbench Faraday cage method
2006-01-27 export to doc file  EN  FR  DE
EN 62132-8:2012 (pr=23299)
Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method
2012-09-21 export to doc file  EN  FR  DE
EN 62215-3:2013 (pr=24071)
Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method
2013-10-04 export to doc file  EN  FR  DE
EN 62433-2:2010 (pr=21163)
EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)
2010-01-07 export to doc file  EN  FR  DE

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CLC/SR 47A Maintenance cycle

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Project in progress
CECC 290 001:1997 (pr=8291)
Technology Approval Schedule: Manufacture of microelectronic integrated circuits and ASICs
1997-02-042002-02-042005-02-04CLC/SR 47A 
CECC 90 104:1990 (pr=1316)
Family Specification: C. MOS digital integrated circuits - Series 4000 B and 4000 UB (with A1)
1990-01-011995-01-011998-01-01CLC/SR 47A 
CECC 90 105:1986 (pr=1347)
Blank Detail Specification: Fusible link programmable bipolar read only memories, silicon monolithic integrated circuits (with A1 & A2)
1986-01-011991-01-011994-01-01CLC/SR 47A 
CECC 90 114:1994 (pr=1555)
Blank Detail Specification: Programmable logic arrays (PLA) (with A1)
1994-07-151999-07-152002-07-15CLC/SR 47A 
CECC 90 115:1993 (pr=1558)
Blank Detail Specification: Digital gate array integrated circuits
1993-12-151998-12-152001-12-15CLC/SR 47A 
CECC 90 200:1987 (pr=1303)
Sectional Specification: Analogue monolithic integrated circuits (with A1)
1987-01-011992-01-011995-01-01CLC/SR 47A 
CECC 90 201:1988 (pr=1317)
Blank Detail Specification: Integrated voltage regulators (with A1)
1988-01-011993-01-011996-01-01CLC/SR 47A 
CECC 90 202:1989 (pr=1406)
Blank Detail Specification: Integrated operational amplifiers (with A1)
1989-01-011994-01-011997-01-01CLC/SR 47A 
CECC 90 203:1985 (pr=6620)
Blank Detail Specification: Integrated analogue switching circuits
1985-12-151990-12-151993-12-15CLC/SR 47A 
CECC 90 300:1994 (pr=1403)
Sectional Specification: Interface monolithic integrated circuits (with A1)
1994-09-151999-09-152002-09-15CLC/SR 47A 
CECC 90 302:1985 (pr=6621)
Blank Detail Specification: Integrated voltage comparators (with A1)
1985-12-151990-12-151993-12-15CLC/SR 47A 
EN 163100:1991 (pr=6115)
Sectional Specification: Film and hybrid integrated circuits
1991-12-151996-12-151999-12-15CLC/SR 47A 
EN 163101:1991 (pr=6116)
Blank Detail Specification: Film and hybrid integrated circuits
1991-12-151996-12-151999-12-15CLC/SR 47A 
EN 165000-1:1996 (pr=1328)
Film and hybrid integrated circuits - Part 1: Generic specification - Capability approval procedure
1996-04-162001-04-162004-04-16CLC/SR 47A 
EN 165000-2:1996 (pr=7574)
Film and hybrid integrated circuits - Part 2: Internal visual inspection and special tests
1996-04-162001-04-162004-04-16CLC/SR 47A 
EN 165000-3:1996 (pr=7575)
Film and hybrid integrated circuits - Part 3: Self-audit checklist and report for film and hybrid integrated circuit manufacturers
1996-04-172001-04-172004-04-17CLC/SR 47A 
EN 165000-4:1996 (pr=7576)
Film and hybrid integrated circuits - Part 4: Customer information, product assessment level schedules and blank detail specification
1996-04-172001-04-172004-04-17CLC/SR 47A 
EN 190000:1995 (pr=1417)
Generic Specification: Monolithic integrated circuits
1995-06-212000-06-212003-06-21CLC/SR 47A 
EN 190100:1993 (pr=6134)
Sectional Specification: Digital monolithic integrated circuits
1993-04-151998-04-152001-04-15CLC/SR 47A 
EN 190101:1994 (pr=5460)
Family Specification: Digital integrated TTL circuits - Series 54, 64, 74, 84
1994-05-151999-05-152002-05-15CLC/SR 47A 
EN 190102:1994 (pr=5461)
Family Specification: TTL-Schottky digital integrated circuits - Series 54S, 64S, 74S, 84S
1994-05-151999-05-152002-05-15CLC/SR 47A 
EN 190103:1994 (pr=5462)
Family Specification: Digital integrated TTL low power Schottky circuits - Series 54LS, 64LS, 74LS, 84LS
1994-05-151999-05-152002-05-15CLC/SR 47A 
EN 190106:1994 (pr=5463)
Family Specification: TTL advanced low power Schottky digital integrated circuits - Series 54ALS, 74ALS
1994-05-151999-05-152002-05-15CLC/SR 47A 
EN 190107:1994 (pr=5464)
Family Specification: TTL FAST digital integrated circuits - Series 54F, 74F
1994-05-151999-05-152002-05-15CLC/SR 47A 
EN 190108:1994 (pr=5465)
Family Specification: TTL advanced Schottky digital integrated circuits - Series 54AS, 74AS
1994-05-151999-05-152002-05-15CLC/SR 47A 
EN 190109:1994 (pr=5466)
Family Specification: Digital integrated HC MOS circuits - Series HC/HCT/HCU
1994-05-151999-05-152002-05-15CLC/SR 47A 
EN 190110:1994 (pr=5778)
Blank Detail Specification: Digital microprocessor integrated circuits
1994-05-151999-05-152002-05-15CLC/SR 47A 
EN 190116:1993 (pr=1301)
Family Specification: AC MOS Digital integrated circuits
1993-08-151998-08-152001-08-15CLC/SR 47A 
EN 61943:1999 (pr=12898)
Integrated circuits - Manufacturing line approval application guideline
1999-08-09 2007-08-09CLC/SR 47A 
EN 61964:1999 (pr=12934)
Integrated circuits - Memory devices pin configurations
1999-05-31 2007-05-31CLC/SR 47A 
EN 61967-1:2002 (pr=13700)
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
2002-06-05 2010-06-05CLC/SR 47A 
EN 61967-2:2005 (pr=16243)
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
2005-10-25 2013-10-25CLC/SR 47A 
EN 61967-4:2002 (pr=14191)
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
2002-06-14 2010-06-14CLC/SR 47A 
EN 61967-4:2002/A1:2006 (pr=16202)
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
2006-02-28 2014-02-28CLC/SR 47A 
EN 61967-5:2003 (pr=14508)
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions - Workbench Faraday Cage method
2003-04-23 2011-04-23CLC/SR 47A 
EN 61967-6:2002 (pr=14186)
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
2002-10-08 2010-10-08CLC/SR 47A 
EN 61967-6:2002/A1:2008 (pr=17129)
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
2008-05-14 2016-05-14CLC/SR 47A 
EN 61967-8:2011 (pr=22743)
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
2011-10-14 2019-10-14CLC/SR 47A 
EN 62132-1:2006 (pr=16169)
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 1: General conditions and definitions
2006-02-10 2017-01-28CLC/SR 47AFprEN 62132-1:2014
EN 62132-2:2011 (pr=21926)
Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method
2011-03-04 2019-03-04CLC/SR 47A 
EN 62132-3:2007 (pr=17166)
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 3: Bulk current injection (BCI) method
2007-10-10 2015-10-10CLC/SR 47A 
EN 62132-4:2006 (pr=16170)
Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method
2006-05-19 2014-05-19CLC/SR 47A 
EN 62132-5:2006 (pr=16128)
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 5: Workbench Faraday cage method
2006-01-27 2014-01-27CLC/SR 47A 
EN 62132-8:2012 (pr=23299)
Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method
2012-09-21 2020-09-21CLC/SR 47A 
EN 62215-3:2013 (pr=24071)
Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method
2013-10-04 2021-10-04CLC/SR 47A 
EN 62433-2:2010 (pr=21163)
EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)
2010-01-07 2018-01-07CLC/SR 47A 

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TC 3 Project files


CLC/SR 47A TC/SC in figures

Current Stage
Year
Year -1
Year -2
Year -3
Year -4
Year >5
Approval stage100000
Published0112141
Withdrawn0000016

CLC/SR 47A Figures overall

Total publications
32
Published in last 3 years
7
Total work in progress
15
Total proposals
0
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CLC/SR 47A Environment

Reference
Clause
Categories - Aspects
Product Life Cycle
Information
Confirmed

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CLC/SR 47A EU Directive(s)

Reference
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Directive
OJ Status
OJ Reference
Mandate