Publication number | Date of Publication | Review date | Result date | Technical Comittee | Project in progress |
|---|
EN 166100:1998 (pr=1685)
Sectional Specification: Surface acoustic wave (SAW) filters | 1998-08-18 | 2003-08-18 | 2006-08-18 | CLC/SR 49 | |
EN 166101:1999 (pr=1686)
Blank Detail Specification: Surface Acoustic Wave (SAW) filters - Capability approval | 1999-02-12 | 2004-02-12 | 2007-02-12 | CLC/SR 49 | |
EN 168100:1993 (pr=6119)
Sectional Specification: Quartz crystal units (Capability approval) | 1993-03-15 | 1998-03-15 | 2001-03-15 | CLC/SR 49 | |
EN 168101:1992 (pr=6120)
Blank Detail Specification: Quartz crystal units (Capability approval) | 1992-05-15 | 1997-05-15 | 2000-05-15 | CLC/SR 49 | |
EN 168200:1993 (pr=6121)
Sectional Specification: Quartz crystal units (Qualification approval) | 1993-04-15 | 1998-04-15 | 2001-04-15 | CLC/SR 49 | |
EN 168200:1993/A1:1993 (pr=1687)
Sectional Specification: Quartz crystal units (Qualification approval) | 1993-04-15 | 1998-04-15 | 2001-04-15 | CLC/SR 49 | |
EN 168201:1992 (pr=6122)
Blank Detail Specification: Quartz crystal units (Qualification approval) | 1992-05-15 | 1997-05-15 | 2000-05-15 | CLC/SR 49 | |
EN 169000:1992 (pr=6123)
Generic Specification: Quartz crystal controlled oscillators | 1992-12-15 | 1997-08-05 | 1998-02-20 | CLC/SR 49 | EN 60679-1:1998 |
EN 169000:1992/A1:1998 (pr=1692)
Generic Specification: Quartz crystal controlled oscillators | 1998-02-12 | 1997-08-05 | 1998-02-20 | CLC/SR 49 | EN 60679-1:1998 |
EN 169100:1993 (pr=6124)
Sectional Specification: Quartz crystal controlled oscillators (Capability approval) | 1993-05-15 | 1997-08-18 | 1998-02-20 | CLC/SR 49 | EN 60679-4:1998 |
EN 169101:1993 (pr=1683)
Blank Detail Specification: Quartz crystal controlled oscillators (Capability approval) | 1993-02-01 | 1997-09-30 | 1998-04-23 | CLC/SR 49 | EN 60679-4-1:1998 |
EN 169200:1995 (pr=1696)
Sectional Specification: Quartz crystal controlled oscillators (Qualification approval) | 1995-07-28 | 2000-07-28 | 2003-07-28 | CLC/SR 49 | |
EN 169201:1995 (pr=1697)
Blank Detail Specification: Quartz crystal controlled oscillators (Qualification approval) | 1995-07-28 | 2000-07-28 | 2003-07-28 | CLC/SR 49 | |
EN 170100:2001 (pr=11968)
Sectional Specification: Waveguide type dielectric resonators | 2001-08-07 | 2006-08-07 | 2009-08-07 | CLC/SR 49 | |
EN 170101:2001 (pr=13047)
Blank detail Specification: Waveguide type dielectric resonators - Capability approval | 2001-08-07 | 2006-08-07 | 2009-08-07 | CLC/SR 49 | |
EN 50324-1:2002 (pr=1705)
Piezoelectric properties of ceramic materials and components - Part 1: Terms and definitions | 2002-05-31 | 2007-05-31 | 2010-05-31 | CLC/SR 49 | |
EN 50324-2:2002 (pr=7541)
Piezoelectric properties of ceramic materials and components - Part 2: Methods of measurement - Low power | 2002-05-31 | 2007-05-31 | 2010-05-31 | CLC/SR 49 | |
EN 50324-3:2002 (pr=7542)
Piezoelectric properties of ceramic materials and components - Part 3: Methods of measurement - High power | 2002-05-31 | 2007-05-31 | 2010-05-31 | CLC/SR 49 | |
EN 60122-1:2002 (pr=14458)
Quartz crystal units of assessed quality - Part 1: Generic specification | 2002-12-10 | | 2010-12-10 | CLC/SR 49 | |
EN 60122-3:2001 (pr=13689)
Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections | 2001-10-19 | | 2010-12-10 | CLC/SR 49 | EN 60122-3:2010 |
EN 60122-3:2010 (pr=22692)
Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections | 2010-12-10 | | 2018-12-10 | CLC/SR 49 | |
EN 60368-1:2000 (pr=12170)
Piezoelectric filters of assessed quality - Part 1: Generic specification | 2000-04-14 | | 2008-04-14 | CLC/SR 49 | |
EN 60368-1:2000/A1:2004 (pr=15989)
Piezoelectric filters of assessed quality - Part 1: Generic specification | 2004-09-20 | | 2012-09-20 | CLC/SR 49 | |
EN 60368-2-2:1999 (pr=8152)
Piezoelectric filters - Part 2: Guide to the use of piezoelectric filters - Section 2: Piezoelectric ceramic filters | 1999-02-12 | | 2007-02-12 | CLC/SR 49 | |
EN 60368-3:2001 (pr=13679)
Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections | 2001-10-23 | | 2010-12-03 | CLC/SR 49 | EN 60368-3:2010 |
EN 60368-3:2010 (pr=22693)
Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections | 2010-12-03 | | 2018-12-03 | CLC/SR 49 | |
EN 60368-4-1:2000 (pr=12353)
Piezoelectric filters of assessed quality - Part 4-1: Blank detail specification - Capability approval | 2000-12-21 | | 2008-12-21 | CLC/SR 49 | |
EN 60368-4:2000 (pr=12332)
Piezoelectric filters of assessed quality - Part 4: Sectional specification - Capability approval | 2000-12-21 | | 2008-12-21 | CLC/SR 49 | |
EN 60444-11:2010 (pr=22330)
Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction | 2010-11-05 | | 2018-11-05 | CLC/SR 49 | |
EN 60444-1:1997 (pr=6937)
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network | 1997-04-16 | | 2005-04-16 | CLC/SR 49 | |
EN 60444-1:1997/A1:1999 (pr=13152)
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network | 1999-10-19 | | 2007-10-19 | CLC/SR 49 | |
EN 60444-2:1997 (pr=6934)
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units | 1997-04-16 | | 2005-04-16 | CLC/SR 49 | |
EN 60444-3:1997 (pr=6933)
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 3: Basic method for the measurement of two-terminal parameters of quartz crystal units up to 200 MHz by phase technique in a pi-network with compensation of the parallel capacitance C0 | 1997-04-16 | | 2005-04-16 | CLC/SR 49 | |
EN 60444-4:1997 (pr=6932)
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz | 1997-04-17 | | 2005-04-17 | CLC/SR 49 | |
EN 60444-5:1997 (pr=6823)
Measurement of quartz crystal unit parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction | 1997-04-17 | | 2005-04-17 | CLC/SR 49 | |
EN 60444-6:1997 (pr=6824)
Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) | 1997-04-17 | | 2015-07-24 | CLC/SR 49 | FprEN 60444-6:2012 |
EN 60444-7:2004 (pr=15780)
Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units | 2004-06-16 | | 2012-06-16 | CLC/SR 49 | |
EN 60444-8:2003 (pr=15237)
Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units | 2003-10-14 | | 2011-10-14 | CLC/SR 49 | |
EN 60444-9:2007 (pr=16925)
Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units | 2007-04-12 | | 2015-04-12 | CLC/SR 49 | |
EN 60679-1:2007 (pr=16906)
Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification | 2007-06-06 | | 2015-06-06 | CLC/SR 49 | |
EN 60679-3:2001 (pr=13680)
Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections | 2001-10-24 | | 2014-06-28 | CLC/SR 49 | EN 60679-3:201X |
EN 60679-4-1:1998 (pr=11777)
Quartz crystal controlled oscillators of assessed quality - Part 4-1: Blank detail specification - Capability approval | 1998-04-23 | | 2006-04-23 | CLC/SR 49 | |
EN 60679-4:1998 (pr=11688)
Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional specification - Capability approval | 1998-02-20 | | 2006-02-20 | CLC/SR 49 | |
EN 60679-5-1:1998 (pr=11952)
Quartz crystal controlled oscillators of assessed quality - Part 5-1: Blank detail specification - Qualification approval | 1998-08-07 | | 2006-08-07 | CLC/SR 49 | |
EN 60679-5:1998 (pr=11907)
Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval | 1998-08-07 | | 2006-08-07 | CLC/SR 49 | |
EN 60679-6:2011 (pr=22046)
Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines | 2011-04-22 | | 2019-04-22 | CLC/SR 49 | |
EN 60689:2009 (pr=21475)
Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values | 2009-03-27 | | 2017-03-27 | CLC/SR 49 | |
EN 60758:2009 (pr=21390)
Synthetic quartz crystal - Specifications and guidelines for use | 2009-01-09 | | 2017-01-09 | CLC/SR 49 | |
EN 60862-1:2003 (pr=15015)
Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification | 2003-08-29 | | 2011-08-29 | CLC/SR 49 | |
EN 60862-2:2002 (pr=13771)
Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidance on use | 2002-09-19 | | 2012-08-03 | CLC/SR 49 | EN 60862-2:2012 |
EN 60862-2:2012 (pr=23260)
Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use | 2012-08-03 | | 2020-08-03 | CLC/SR 49 | |
EN 60862-3:2003 (pr=15090)
Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines | 2003-12-19 | | 2011-12-19 | CLC/SR 49 | |
EN 61019-1:2005 (pr=15688)
Surface acoustic wave (SAW) resonators - Part 1: Generic specification | 2005-01-13 | | 2013-01-13 | CLC/SR 49 | |
EN 61019-2:2005 (pr=16419)
Surface acoustic wave (SAW) resonators - Part 2: Guide to the use | 2005-06-22 | | 2013-06-22 | CLC/SR 49 | |
EN 61240:1997 (pr=6403)
Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules | 1997-03-10 | | 2012-10-05 | CLC/SR 49 | EN 61240:2012 |
EN 61240:2012 (pr=23282)
Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules | 2012-10-05 | | 2020-10-05 | CLC/SR 49 | |
EN 61337-1:2004 (pr=16079)
Filters using waveguide type dielectric resonators - Part 1: Generic specification | 2004-12-14 | | 2012-12-14 | CLC/SR 49 | |
EN 61337-2:2004 (pr=15707)
Filters using waveguide type dielectric resonators - Part 2: Guidance for use | 2004-10-05 | | 2012-10-05 | CLC/SR 49 | |
EN 61338-1-3:2000 (pr=12051)
Waveguide type dielectric resonators - Part 1-3: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at microwave frequency | 2000-03-22 | | 2008-03-22 | CLC/SR 49 | |
EN 61338-1-4:2006 (pr=16746)
Waveguide type dielectric resonators - Part 1-4: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency | 2006-02-03 | | 2014-02-03 | CLC/SR 49 | |
EN 61338-1:2005 (pr=16065)
Waveguide type dielectric resonators - Part 1: Generic specification | 2005-01-17 | | 2013-01-17 | CLC/SR 49 | |
EN 61338-2:2004 (pr=15647)
Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications | 2004-09-09 | | 2012-09-09 | CLC/SR 49 | |
EN 61338-4-1:2005 (pr=16173)
Waveguide type dielectric resonators - Part 4-1: Blank detail specification | 2005-05-19 | | 2013-05-19 | CLC/SR 49 | |
EN 61338-4:2005 (pr=16172)
Waveguide type dielectric resonators - Part 4: Sectional specification | 2005-05-19 | | 2013-05-19 | CLC/SR 49 | |
EN 61837-1:1999 (pr=12935)
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines | 1999-06-03 | | 2012-08-17 | CLC/SR 49 | EN 61837-1:2012 |
EN 61837-1:2012 (pr=23253)
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines | 2012-08-17 | | 2020-08-17 | CLC/SR 49 | |
EN 61837-2:2000 (pr=13744)
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures | 2000-11-30 | | 2011-07-08 | CLC/SR 49 | EN 61837-2:2011 |
EN 61837-2:2011 (pr=22678)
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures | 2011-07-08 | | 2019-07-08 | CLC/SR 49 | |
EN 61837-3:2000 (pr=13743)
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures | 2000-11-30 | | 2008-11-30 | CLC/SR 49 | |
EN 61837-4:2004 (pr=15871)
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines | 2004-11-09 | | 2012-11-09 | CLC/SR 49 | |
EN 62276:2005 (pr=16510)
Single crystal wafers for surface acoustic wave (SAW) device appplications - Specifications and measuring methods | 2005-12-01 | | 2013-01-11 | CLC/SR 49 | EN 62276:2013 |
EN 62276:2013 (pr=23153)
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods | 2013-01-11 | | 2021-01-11 | CLC/SR 49 | |
EN 62575-2:2012 (pr=23386)
Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 2: Guidelines for the use | 2012-09-21 | | 2020-09-21 | CLC/SR 49 | |
EN 62604-2:2012 (pr=22691)
Surface Acoustic Wave (SAW) and Bulk Acoustic Wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use | 2012-02-03 | | 2020-02-03 | CLC/SR 49 | |