International Standards and Conformity Assessment for all electrical, electronic and related technologies



Reference EN 60749-34:2004
Title Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling
Project Number 15618
Abstract/Scope Used to determine the resistance of a semiconductor device to thermal and mechanical stresses due to cycling the power dissipation of the internal semiconductor die and internal connectors. This happens when low-voltage operating biases for forward conduction (load currents) are periodically applied and removed causing rapid changes of temperature. The power cycling test is complementary to high temperature operating life.


Current Stage code 6060
Current Stage code date 2004-04-16
Current Stage code deadline 2005-01-01
Deadline date for vote  


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IEC Technical Body IEC/TC 47
Reference Document IEC 60749-34:2004 (EQV)
ICS 31.080 - Semiconductor devices
Keywords Semiconductor; Mechanical; Climatic; Test method; Power cycling
Note Superseded by EN 60749-34:2010
Special National Condition(s)  


Categories - Aspects
Product Life Cycle


Deadline Date
6060 2004-04-16 2005-01-01 export to doc file  EN  FR  DE
5099 2004-04-01 2004-08-01  
5061 2004-02-23 2004-04-01  
5020 2003-11-21 2004-01-23  
4099 2003-10-17 2003-11-30  
4020 2002-12-20 2003-05-23  
3099 2002-12-17 2002-12-20  

Implementation Dates

date of Ratification (DOR) (1) 2004-04-01
date of Availability (DAV) (2) 2004-04-16
date of Announcement (DOA) (3) 2004-07-01
date of Publication (DOP) (4) 2005-01-01
date of Withdrawal (DOW) (5) 2007-04-01


Superseded by EN 60749-34:2010
Normative reference (6) IEC 60747-1:1983
IEC 60747-2:1983
IEC 60747-6:1983
EN 60747-15:2004
IEC 60748-23-5:2003
EN 60749-3:2002
EN 60749-23:2004

(1) Date of ratification (dor) date when the Technical Board notes the approval of an EN (and HD for CENELEC), from which time the standard may be said to be approved

(2) Date of availability (dav) date when the definitive text in the official language versions of an approved CEN/CENELEC publication is distributed by the Central Secretariat

(3) Date of announcement (doa) latest date by which the existence of an EN (and HD for CENELEC), a TS or a CWA has to be announced at national level

(4) Date of publication (dop) latest date by which an EN has to be implemented at national level by publication of an identical national standard or by endorsement

(5) Date of withdrawal (dow) latest date by which national standards conflicting with an EN (and HD for CENELEC) have to be withdrawn

(6) This list of normative references is purely indicative. The only official list of normative reference is the list of the published standard.