CENELEC
Project
| Reference | EN 55017:2011 |
|---|---|
| Title | Methods of measurement of the suppression characteristics of passive EMC filtering devices |
| Project Number | 22839 |
| Abstract/Scope | CISPR 17:2011 specifies methods to measure the radio interference suppression characteristics of passive EMC filtering devices used in power and signal lines, and in other circuits. The defined methods may also be applied to combinations of over-voltage protection devices and EMC filtering devices. The measurement method covers the frequency range from 9 kHz to several GHz depending on the device and test circuit. The standard describes procedures for laboratory tests (type tests) as well as factory tests. The suppression characteristics of EMC filters and components used for the suppression of EM disturbances, are a function of numerous variables such as impedance of the circuits to which they connect, operating voltage and current, and ambient temperature. This standard specifies uniform test methods that will enable comparison of filtering and suppression characteristics determined by test laboratories or specified by manufacturers. Measurement procedures are provided for unbiased and bias conditions. Measurements under bias conditions are performed to determine potential non-linear behaviour of the EMC filtering devices such as saturation effects in inductors with magnetic cores. This testing serves to show the usability in a specific application (such as frequency converters that produce high amplitudes of common mode pulse current and thus may drive inductors into saturation). Measurement under bias conditions may be omitted if the non-linear behaviour can be determined by other methods (e.g. separate saturation measurement of the inductors used). The first edition of CISPR 17 (1981) prescribed the measurement methods of insertion loss mainly for power-line filters. Today, however, many types of sophisticated EMC filters and suppression components can be found in various electronic devices. Those filters need to be characterized using standardized measurement methods. New methods for measurement of impedance and S-parameters for such EMI devices are included in this second edition. |
| Status |
Published
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Status
| Current Stage code | 6060 |
|---|---|
| Current Stage code date | 2011-09-30 |
| Current Stage code deadline | 2012-04-15 |
| Deadline date for vote |
Legal
| Directive(s) | EMC related (2004/108/EC) |
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| Mandate(s) | |
| Order Voucher |
Details
| IEC Technical Body | IEC/SC CISPR/A |
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| Reference Document | CISPR 17:2011 (EQV) |
| ICS | 33.100.01 - Electromagnetic compatibility in general |
| Keywords | EMC; Filtering; Measurement; Suppression characteristics; Passive device |
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History
Implementation Dates
| date of Ratification (DOR) (1) | 2011-07-15 |
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| date of Availability (DAV) (2) | 2011-09-30 |
| date of Announcement (DOA) (3) | 2011-10-15 |
| date of Publication (DOP) (4) | 2012-04-15 |
| date of Withdrawal (DOW) (5) | 2014-07-15 |
Relations
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| Superseded by | |
| Normative reference (6) | IEC 60050-161:1990 |
(1) Date of ratification (dor) date when the Technical Board notes the approval of an EN (and HD for CENELEC), from which time the standard may be said to be approved
(2) Date of availability (dav) date when the definitive text in the official language versions of an approved CEN/CENELEC publication is distributed by the Central Secretariat
(3) Date of announcement (doa) latest date by which the existence of an EN (and HD for CENELEC), a TS or a CWA has to be announced at national level
(4) Date of publication (dop) latest date by which an EN has to be implemented at national level by publication of an identical national standard or by endorsement
(5) Date of withdrawal (dow) latest date by which national standards conflicting with an EN (and HD for CENELEC) have to be withdrawn
(6) This list of normative references is purely indicative. The only official list of normative reference is the list of the published standard.
