International Standards and Conformity Assessment for all electrical, electronic and related technologies



Reference EN 61000-4-20:2003
Title Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
Project Number 14913
Abstract/Scope Relates to emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. This includes open (for example, striplines and EMP simulators) and closed (for example, TEM cells) structures, which can be further classified as one-, two-, or multi-port TEM waveguides. The frequency range depends on the specific testing requirements and the specific TEM waveguide type. The object of this standard is to describe · TEM waveguide characteristics, including typical frequency ranges and EUT-size limitations (EUT = equipment under test); · TEM waveguide validation methods for EMC measurements; · the EUT (i.e. EUT cabinet and cabling) definition; · test set-ups, procedures, and requirements for radiated emission testing in TEM waveguides and · test set-ups, procedures, and requirements for radiated immunity testing in TEM waveguides.


Current Stage code 6060
Current Stage code date 2003-04-28
Current Stage code deadline 2004-01-01
Deadline date for vote  


Directive(s) EMC related (2004/108/EC)
Mandate(s) M/490
Order Voucher  


IEC Technical Body IEC/SC 77B
Reference Document IEC 61000-4-20:2003 (EQV)
ICS 33.100.10 - Emission
33.100.20 - Immunity
Keywords Electromagnetic compatibility; Emission; Immunity; Transverse Waveguide; TEM
Note Superseded by EN 61000-4-20:2010
Special National Condition(s)  


Categories - Aspects
Product Life Cycle


Deadline Date
6060 2003-04-28 2004-01-01 export to doc file  EN
5099 2003-04-01 2003-08-01  
5061 2003-02-27 2003-04-01  
5020 2002-10-18 2003-01-10  
4099 2002-10-15 2002-10-18  
4020 2001-12-07 2002-05-10  
3099 2001-12-04 2001-12-07  

Implementation Dates

date of Ratification (DOR) (1) 2003-04-01
date of Availability (DAV) (2) 2003-04-28
date of Announcement (DOA) (3) 2003-07-01
date of Publication (DOP) (4) 2004-01-01
date of Withdrawal (DOW) (5) 2006-04-01


Superseded by EN 61000-4-20:2010
Normative reference (6) CISPR 16-1:1999
CISPR 16-2:1996
EN 55022:1998
corr. August 1999
corr. July 2001
corr. July 2003
corr. March 2005
IEC 60050-161:1990
EN 60068-1:1994
IEC 61000-2-11:1999
EN 61000-4-3:2002
EN 61000-4-23:2000
IEC/TR 61000-4-32:2002
IEC/TR 61000-5-3:1999

(1) Date of ratification (dor) date when the Technical Board notes the approval of an EN (and HD for CENELEC), from which time the standard may be said to be approved

(2) Date of availability (dav) date when the definitive text in the official language versions of an approved CEN/CENELEC publication is distributed by the Central Secretariat

(3) Date of announcement (doa) latest date by which the existence of an EN (and HD for CENELEC), a TS or a CWA has to be announced at national level

(4) Date of publication (dop) latest date by which an EN has to be implemented at national level by publication of an identical national standard or by endorsement

(5) Date of withdrawal (dow) latest date by which national standards conflicting with an EN (and HD for CENELEC) have to be withdrawn

(6) This list of normative references is purely indicative. The only official list of normative reference is the list of the published standard.