International Standards and Conformity Assessment for all electrical, electronic and related technologies



Reference EN 60749-29:2011
Title Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
Project Number 22643
Abstract/Scope IEC 60749-29:2011 covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is toestablish a method for determining integrated circuit (IC) latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing 'no trouble found' (NTF) and 'electrical overstress' (EOS) failures due to latch-up. This second edition cancels and replaces the first edition published in 2003 and constitutes a technical revision. The significant changes with respect to the previous edition include: - a number of minor technical changes; - the addition of two new annexes covering the testing of special pins and temperature calculations.


Current Stage code 6060
Current Stage code date 2011-08-19
Current Stage code deadline 2012-02-12
Deadline date for vote  


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IEC Technical Body IEC/TC 47
Reference Document IEC 60749-29:2011 (EQV)
ICS 31.080.01 - Semiconductor devices in general
Keywords Semiconductor; Mechanical; Climatic; Latch-up; Test method
Note Supersedes EN 60749-29:2003 + corr. Mar.2004
Special National Condition(s)  


Categories - Aspects
Product Life Cycle


Deadline Date
6060 2011-08-19 2012-02-12 export to doc file  EN  FR  DE
5099 2011-05-12 2011-06-09  
5060 2011-03-21 2011-04-11 export to doc file  EN
5020 2011-01-14 2011-03-18  
3090 2010-08-27 2010-10-12  
5060 2010-02-08 2010-02-22 export to doc file  EN
5020 2009-09-04 2010-02-05  
1090 2009-09-01 2009-09-04  

Implementation Dates

date of Ratification (DOR) (1) 2011-05-12
date of Availability (DAV) (2) 2011-08-19
date of Announcement (DOA) (3) 2011-08-12
date of Publication (DOP) (4) 2012-02-12
date of Withdrawal (DOW) (5) 2014-05-12


Supersedes EN 60749-29:2003
EN 60749-29:2003/corrigendum Mar. 2004
Superseded by  
Normative reference (6)  

(1) Date of ratification (dor) date when the Technical Board notes the approval of an EN (and HD for CENELEC), from which time the standard may be said to be approved

(2) Date of availability (dav) date when the definitive text in the official language versions of an approved CEN/CENELEC publication is distributed by the Central Secretariat

(3) Date of announcement (doa) latest date by which the existence of an EN (and HD for CENELEC), a TS or a CWA has to be announced at national level

(4) Date of publication (dop) latest date by which an EN has to be implemented at national level by publication of an identical national standard or by endorsement

(5) Date of withdrawal (dow) latest date by which national standards conflicting with an EN (and HD for CENELEC) have to be withdrawn

(6) This list of normative references is purely indicative. The only official list of normative reference is the list of the published standard.