International Standards and Conformity Assessment for all electrical, electronic and related technologies



Reference EN 60749-2:2002
Title Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure
Project Number 13960
Abstract/Scope Covers the testing of low air pressure on semiconductor devices. The test is intended primarily to determine the ability of component parts and materials to avoid voltage breakdown failures due to the reduced dielectric strength of air and other insulating materials at reduced pressures is only applicable to devices where the operating voltage exceeds 1 000 V. This test is applicable to all semiconductor devices provided they are in cavity type packages. The test is intended for military and space-related applications only.


Current Stage code 6060
Current Stage code date 2002-08-13
Current Stage code deadline 2003-04-01
Deadline date for vote  


Order Voucher  


IEC Technical Body IEC/TC 47
Reference Document IEC 60749-2:2002 (EQV)
ICS 31.080.01 - Semiconductor devices in general
Keywords Semiconductor; Mechanical; Climatic; Test method; Low air pressure
Note Supersedes Clause 3 of Chapter 3 of EN 60749:1999
Special National Condition(s)  


Categories - Aspects
Product Life Cycle


Deadline Date
6060 2002-08-13 2003-04-01 export to doc file  EN
5099 2002-07-02 2002-11-02  
5061 2002-05-24 2002-07-02  
5020 2002-01-18 2002-03-22  
4099 2002-01-15 2002-01-18  
4098 2000-10-03    
4020 2000-07-28 2001-01-02  
3099 2000-07-24 2000-07-28  

Implementation Dates

date of Ratification (DOR) (1) 2002-07-02
date of Availability (DAV) (2) 2002-08-13
date of Announcement (DOA) (3) 2002-10-01
date of Publication (DOP) (4) 2003-04-01
date of Withdrawal (DOW) (5) 2005-07-01


Supersedes EN 60749:1999
EN 60749:1999/A1:2000
EN 60749:1999/A2:2001
Superseded by  
Normative reference (6) EN 60068-2-13:1999

(1) Date of ratification (dor) date when the Technical Board notes the approval of an EN (and HD for CENELEC), from which time the standard may be said to be approved

(2) Date of availability (dav) date when the definitive text in the official language versions of an approved CEN/CENELEC publication is distributed by the Central Secretariat

(3) Date of announcement (doa) latest date by which the existence of an EN (and HD for CENELEC), a TS or a CWA has to be announced at national level

(4) Date of publication (dop) latest date by which an EN has to be implemented at national level by publication of an identical national standard or by endorsement

(5) Date of withdrawal (dow) latest date by which national standards conflicting with an EN (and HD for CENELEC) have to be withdrawn

(6) This list of normative references is purely indicative. The only official list of normative reference is the list of the published standard.