International Standards and Conformity Assessment for all electrical, electronic and related technologies

 

Project

Reference EN 60749-7:2011
Title Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
Project Number 22606
Abstract/Scope IEC 60749-7:2011 specifies the testing and measurement of water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. The test is used as a measure of the quality of the sealing process and to provide information about the long-term chemical stability of the atmosphere inside the package. It is applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace. This test is destructive. This second edition cancels and replaces the first edition published in 2002 and constitutes a technical revision. This second edition has been completely re-written so as to align it with the text of the latest versions of MIL-STD-750, method 1018 and MIL-STD-883, method 1018. The main change is the removal of the two alternative methods formerly designated method 2 and method 3.
Status
Published

Status

Current Stage code 6060
Current Stage code date 2011-09-09
Current Stage code deadline 2012-04-22
Deadline date for vote  

Legal

Directive(s)  
Mandate(s)  
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Details

IEC Technical Body IEC/TC 47
Reference Document IEC 60749-7:2011 (EQV)
ICS 31.080.01 - Semiconductor devices in general
Keywords Semiconductor; Mechanical; Climatic; Test method; Moisture
Note Supersedes EN 60749-7:2002
A-Deviation(s)  
Special National Condition(s)  

Environment

Clause
Categories - Aspects
Product Life Cycle
Information

History

Stage
Date
Deadline Date
Documents
6060 2011-09-09 2012-04-22 export to doc file  EN  FR  DE
5099 2011-07-22 2011-08-19  
5060 2011-05-16 2011-06-06 export to doc file  EN
5020 2011-03-11 2011-05-13  
3090 2010-06-11 2010-07-31  
5060 2010-01-11 2010-01-25 export to doc file  EN
5020 2009-07-31 2010-01-08  
1090 2009-07-28 2009-07-31  

Implementation Dates

date of Ratification (DOR) (1) 2011-07-22
date of Availability (DAV) (2) 2011-09-09
date of Announcement (DOA) (3) 2011-10-22
date of Publication (DOP) (4) 2012-04-22
date of Withdrawal (DOW) (5) 2014-07-22

Relations

Supersedes EN 60749-7:2002
Superseded by  
Normative reference (6)  

(1) Date of ratification (dor) date when the Technical Board notes the approval of an EN (and HD for CENELEC), from which time the standard may be said to be approved


(2) Date of availability (dav) date when the definitive text in the official language versions of an approved CEN/CENELEC publication is distributed by the Central Secretariat


(3) Date of announcement (doa) latest date by which the existence of an EN (and HD for CENELEC), a TS or a CWA has to be announced at national level


(4) Date of publication (dop) latest date by which an EN has to be implemented at national level by publication of an identical national standard or by endorsement


(5) Date of withdrawal (dow) latest date by which national standards conflicting with an EN (and HD for CENELEC) have to be withdrawn


(6) This list of normative references is purely indicative. The only official list of normative reference is the list of the published standard.