International Standards and Conformity Assessment for all electrical, electronic and related technologies

 

Project

Reference EN 60749-38:2008
Title Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory
Project Number 20852
Abstract/Scope This part of IEC 60749 establishes a procedure for measuring the soft error susceptibility of semiconductor devices with memory when subjected to energetic particles such as alpha radiation. Two tests are described; an accelerated test using an alpha radiation source and an (unaccelerated) real-time system test where any errors are generated under conditions of naturally occurring radiation which can be alpha or other radiation such as neutron. To completely characterize the soft error capability of an integrated circuit with memory, the device must be tested for broad high energy spectrum and thermal neutrons using additional test methods. This test method may be applied to any type of integrated circuit with memory device.
Status
Published

Status

Current Stage code 6060
Current Stage code date 2008-05-15
Current Stage code deadline 2009-01-01
Deadline date for vote  

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Details

IEC Technical Body IEC/TC 47
Reference Document IEC 60749-38:2008 (EQV)
ICS 31.080.01 - Semiconductor devices in general
Keywords Semiconductor; Mechanical; Climatic; Soft error test; Memory
Note  
A-Deviation(s)  
Special National Condition(s)  

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Categories - Aspects
Product Life Cycle
Information

History

Stage
Date
Deadline Date
Documents
6060 2008-05-15 2009-01-01 export to doc file  EN  FR  DE
5099 2008-04-01 2008-06-01  
5061 2008-02-27 2008-04-01  
5060 2008-01-14 2008-01-28 export to doc file  EN
5020 2007-10-26 2008-01-11  
3090 2007-09-07 2007-09-30  
5060 2007-01-15 2007-01-29 export to doc file  EN
5020 2006-08-11 2007-01-12  
1090 2006-08-08 2006-08-11  

Implementation Dates

date of Ratification (DOR) (1) 2008-04-01
date of Availability (DAV) (2) 2008-05-15
date of Announcement (DOA) (3) 2008-07-01
date of Publication (DOP) (4) 2009-01-01
date of Withdrawal (DOW) (5) 2011-04-01

Relations

Supersedes  
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Normative reference (6)  

(1) Date of ratification (dor) date when the Technical Board notes the approval of an EN (and HD for CENELEC), from which time the standard may be said to be approved


(2) Date of availability (dav) date when the definitive text in the official language versions of an approved CEN/CENELEC publication is distributed by the Central Secretariat


(3) Date of announcement (doa) latest date by which the existence of an EN (and HD for CENELEC), a TS or a CWA has to be announced at national level


(4) Date of publication (dop) latest date by which an EN has to be implemented at national level by publication of an identical national standard or by endorsement


(5) Date of withdrawal (dow) latest date by which national standards conflicting with an EN (and HD for CENELEC) have to be withdrawn


(6) This list of normative references is purely indicative. The only official list of normative reference is the list of the published standard.