International Standards and Conformity Assessment for all electrical, electronic and related technologies

 

Project

Reference EN 60749-27:2006
Title Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
Project Number 16710
Abstract/Scope Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic discharge (ESD). It may be used as an alternative test method to the human body model ESD test method. The objective is to provide reliable, repeatable ESD test results so that accurate classifications can be performed. This test method is applicable to all semiconductor devices and is classified as destructive
Status
Published

Status

Current Stage code 6060
Current Stage code date 2006-08-25
Current Stage code deadline 2007-05-01
Deadline date for vote  

Legal

Directive(s)  
Mandate(s)  
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Details

IEC Technical Body IEC/TC 47
Reference Document IEC 60749-27:2006 (EQV)
ICS 31.080.01 - Semiconductor devices in general
Keywords Semiconductor; Mechanical; Climatic; Electrostatic discharge; Machine model (MM)
Note  
A-Deviation(s)  
Special National Condition(s)  

Environment

Clause
Categories - Aspects
Product Life Cycle
Information

History

Stage
Date
Deadline Date
Documents
6060 2006-08-25 2007-05-01 export to doc file  EN  FR  DE
5099 2006-08-01 2006-10-01  
5060 2006-06-06 2006-06-20 export to doc file  EN
5020 2006-03-31 2006-06-02  
4099 2006-02-03 2006-02-28  
4020 2005-01-14 2005-06-17  
3099 2005-01-11 2005-01-14  

Implementation Dates

date of Ratification (DOR) (1) 2006-08-01
date of Availability (DAV) (2) 2006-08-25
date of Announcement (DOA) (3) 2006-11-01
date of Publication (DOP) (4) 2007-05-01
date of Withdrawal (DOW) (5) 2009-08-01

Relations

Supersedes  
Superseded by  
Normative reference (6) EN 60749-26:2006
EN 61340-3-2:2002

(1) Date of ratification (dor) date when the Technical Board notes the approval of an EN (and HD for CENELEC), from which time the standard may be said to be approved


(2) Date of availability (dav) date when the definitive text in the official language versions of an approved CEN/CENELEC publication is distributed by the Central Secretariat


(3) Date of announcement (doa) latest date by which the existence of an EN (and HD for CENELEC), a TS or a CWA has to be announced at national level


(4) Date of publication (dop) latest date by which an EN has to be implemented at national level by publication of an identical national standard or by endorsement


(5) Date of withdrawal (dow) latest date by which national standards conflicting with an EN (and HD for CENELEC) have to be withdrawn


(6) This list of normative references is purely indicative. The only official list of normative reference is the list of the published standard.