CENELEC
Project
| Reference | EN 61788-17:2013 |
|---|---|
| Title | Superconductivity - Part 17: Electronic characteristic measurements - Local critical current density and its distribution in large-area superconducting films |
| Project Number | 23839 |
| Abstract/Scope | IEC 61788-17:2013 describes the measurements of the local critical current density (Jc) and its distribution in large-area high-temperature superconducting (HTS) films by an inductive method using third-harmonic voltages. The most important consideration for precise measurements is to determine Jc at liquid nitrogen temperatures by an electric-field criterion and obtain current-voltage characteristics from its frequency dependence. Although it is possible to measure Jc in applied DC magnetic fields, the scope of this standard is limited to the measurement without DC magnetic fields. This technique intrinsically measures the critical sheet current that is the product of Jc and the film thickness d. The range and measurement resolution for Jcd of HTS films are from 200 A/m to 32 kA/m, with a measurement resolution of 100 A/m. |
| Status |
Published
|
Status
| Current Stage code | 6060 |
|---|---|
| Current Stage code date | 2013-04-05 |
| Current Stage code deadline | 2013-11-20 |
| Deadline date for vote |
Legal
| Directive(s) | |
|---|---|
| Mandate(s) | |
| Order Voucher |
Details
| IEC Technical Body | IEC/TC 90 |
|---|---|
| Reference Document | IEC 61788-17:2013 (EQV) |
| ICS | 17.220.20 - Measurement of electrical and magnetic quantities 29.050 - Conducting materials |
| Keywords | Superconductivity; Density; Distribution; Films |
| Note | 2013-01-29: Publication editing allocated to cpalagi@cencenelec.eu |
| A-Deviation(s) | |
| Special National Condition(s) |
Environment
|
Clause
|
Categories - Aspects
|
Product Life Cycle
|
Information
|
|---|
History
Implementation Dates
| date of Ratification (DOR) (1) | 2013-02-20 |
|---|---|
| date of Availability (DAV) (2) | 2013-04-05 |
| date of Announcement (DOA) (3) | 2013-05-20 |
| date of Publication (DOP) (4) | 2013-11-20 |
| date of Withdrawal (DOW) (5) | 2016-02-20 |
Relations
| Supersedes | |
|---|---|
| Superseded by | |
| Normative reference (6) | IEC 60050 series |
(1) Date of ratification (dor) date when the Technical Board notes the approval of an EN (and HD for CENELEC), from which time the standard may be said to be approved
(2) Date of availability (dav) date when the definitive text in the official language versions of an approved CEN/CENELEC publication is distributed by the Central Secretariat
(3) Date of announcement (doa) latest date by which the existence of an EN (and HD for CENELEC), a TS or a CWA has to be announced at national level
(4) Date of publication (dop) latest date by which an EN has to be implemented at national level by publication of an identical national standard or by endorsement
(5) Date of withdrawal (dow) latest date by which national standards conflicting with an EN (and HD for CENELEC) have to be withdrawn
(6) This list of normative references is purely indicative. The only official list of normative reference is the list of the published standard.
