CENELEC
Project
| Reference | EN 61788-3:2006 |
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| Title | Superconductivity - Part 3: Critical current measurement - DC critical current of Ag- and/or Ag alloy-sheathed Bi-2212 and Bi-2223 oxide superconductors |
| Project Number | 16789 |
| Abstract/Scope | This part of IEC 61788 covers a test method for the determination of the dc critical current of short and straight Ag- and/or Ag alloy-sheathed Bi-2212 and Bi-2223 oxide superconductors that have a monolithic structure and a shape of round wire or flat or square tape containing mono- or multicores of oxides. This method is intended for use with superconductors that have critical currents less than 500 A and n-values larger than 5. The test is carried out with and without an applying external magnetic field. For all tests in a magnetic field, the magnetic field is perpendicular to the length of the specimen. In the test of a tape specimen in a magnetic field, the magnetic field is parallel or perpendicular to the wider tape surface (or one surface if square). The test specimen is immersed either in a liquid helium bath or a liquid nitrogen bath during testing. Deviations from this test method that are allowed for routine tests and other specific restrictions are given in this standard. |
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Published
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Status
| Current Stage code | 6060 |
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| Current Stage code date | 2006-08-11 |
| Current Stage code deadline | 2007-03-01 |
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Details
| IEC Technical Body | IEC/TC 90 |
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| Reference Document | IEC 61788-3:2006 (EQV) |
| ICS | 17.220 - Electricity. Magnetism. Electrical and magnetic measurements 29.050 - Conducting materials |
| Keywords | Superconductivity; Critical current; DC; Ag alloy-sheathed; Bi-2212/Bi-2223 oxide |
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History
Implementation Dates
| date of Ratification (DOR) (1) | 2006-06-01 |
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| date of Availability (DAV) (2) | 2006-08-11 |
| date of Announcement (DOA) (3) | 2006-09-01 |
| date of Publication (DOP) (4) | 2007-03-01 |
| date of Withdrawal (DOW) (5) | 2009-06-01 |
Relations
| Supersedes | EN 61788-3:2001 |
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| Superseded by | |
| Normative reference (6) | IEC 60050-815:2000 |
(1) Date of ratification (dor) date when the Technical Board notes the approval of an EN (and HD for CENELEC), from which time the standard may be said to be approved
(2) Date of availability (dav) date when the definitive text in the official language versions of an approved CEN/CENELEC publication is distributed by the Central Secretariat
(3) Date of announcement (doa) latest date by which the existence of an EN (and HD for CENELEC), a TS or a CWA has to be announced at national level
(4) Date of publication (dop) latest date by which an EN has to be implemented at national level by publication of an identical national standard or by endorsement
(5) Date of withdrawal (dow) latest date by which national standards conflicting with an EN (and HD for CENELEC) have to be withdrawn
(6) This list of normative references is purely indicative. The only official list of normative reference is the list of the published standard.
