International Standards and Conformity Assessment for all electrical, electronic and related technologies

 

Project

Reference EN 60749-18:2003
Title Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
Project Number 14857
Abstract/Scope Provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 gamma ray source. Proposes an accelerated annealing test for estimating low dose rate ionizing radiation effects on devices. This annealing test is important for low dose rate or certain other applications in which devices may exhibit significant time-dependent effects. It is intended for military- and space-related applications.
Status
Published

Status

Current Stage code 6060
Current Stage code date 2003-02-07
Current Stage code deadline 2003-11-01
Deadline date for vote  

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Details

IEC Technical Body IEC/TC 47
Reference Document IEC 60749-18:2002 (EQV)
ICS 31.080.01 - Semiconductor devices in general
Keywords Semiconductor; Mechanical; Climatic; Test method; Ionizing radiation
Note  
A-Deviation(s)  
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Environment

Clause
Categories - Aspects
Product Life Cycle
Information

History

Stage
Date
Deadline Date
Documents
6060 2003-02-07 2003-11-01 export to doc file  EN
5099 2003-02-01 2003-06-01  
5061 2002-11-26 2003-02-01  
5020 2002-08-30 2002-11-01  
4099 2002-08-27 2002-08-30  
4020 2001-11-09 2002-04-12  
3099 2001-11-06 2001-11-09  

Implementation Dates

date of Ratification (DOR) (1) 2003-02-01
date of Availability (DAV) (2) 2003-02-07
date of Announcement (DOA) (3) 2003-05-01
date of Publication (DOP) (4) 2003-11-01
date of Withdrawal (DOW) (5) 2006-02-01

Relations

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Normative reference (6)  

(1) Date of ratification (dor) date when the Technical Board notes the approval of an EN (and HD for CENELEC), from which time the standard may be said to be approved


(2) Date of availability (dav) date when the definitive text in the official language versions of an approved CEN/CENELEC publication is distributed by the Central Secretariat


(3) Date of announcement (doa) latest date by which the existence of an EN (and HD for CENELEC), a TS or a CWA has to be announced at national level


(4) Date of publication (dop) latest date by which an EN has to be implemented at national level by publication of an identical national standard or by endorsement


(5) Date of withdrawal (dow) latest date by which national standards conflicting with an EN (and HD for CENELEC) have to be withdrawn


(6) This list of normative references is purely indicative. The only official list of normative reference is the list of the published standard.