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Better regulations and innovation - The European and American experience

24 February 2010, Madrid - Presentations are now available

 

Click on the name of the speakers in the programme to view the presentations (in .pdf)

 

Wednesday, 24 February 2010, Madrid

09:00 - 09:30 
Welcome coffee/tea and registration of participants

09:30 
Opening of the meeting

·         Jacques Huchet, Deputy Head of the EC Representation in Spain

·         Ileana Martinez, ANSI – American National Standards Institute

·         John Phillips, ETSI – European Telecommunications Standards Institute

·         Teresa Santero, Industry Secretary General, Government of Spain

09:50 
Welcome address

·         Ramon Naz, AENOR

·         Renate Weissenhorn, European Commission - DG Enterprise & Industry

·         Joe Bhatia, ANSI – American National Standards Institute

Co-chairs of the day:

·         John Phillips, ETSI – European Telecommunications Standards Institute

·         Ileana Martinez, ANSI – American National Standards Institute

10:30
Better regulation: Eco-design
The EU and US sides will give an update on the European and American context in the field of eco-design and on ongoing and/or future standardization activities in coordination with ISO and IEC

·         EU: Villo Lelkes, European Commission - DG Transport and Energy

·         US: James Matthews, Corning

Expert panel discussion
The panel will be formed by representatives from the European Commission, European industry, the US government and the American industry

Moderator: Villo Lelkes, European Commission - DG Transport and Energy

·         EU industry: Begoña Igartua, MCC/Fagor

·         US government: Eric Simmon, NIST – National Institute of Standards and Technology

·         American industry: James Matthews, Corning

11:30 
Coffee break

12:00 
Innovation: the Spanish experience by Avelino Brito, AENOR

12:10
Innovation: Electric vehicles
The EU and US sides will give un update on the European and American context in the field of electric vehicles and on ongoing and/or future standardization activities in coordination with ISO and IEC

·         EU: John Ketchell, CEN-CENELEC Management Centre

·         US: Eric Simmon, NIST

Expert panel discussion
Moderator: US: Joan Sterling, INTERTEK

The panel will be formed by representatives from the European Commission, the European industry, the US government and the American industry

·         EU industry: Manuel de Luna, Ford

·         US government: Eric Simmon, NIST

·         American industry: James Matthews, Corning

13:10 – 14:00
Lunch

14:00
Innovation: Smart grids
Update on the European and American context in the field of smart grids and on ongoing and/or future standardization activities.

·         EU: Johannes Stein, DKE - German Commission for Electrical, Electronic & Information Technologies of DIN and VDE

·         US: David Wollman, NIST 

Expert panel discussion
Moderator: Heidi Hijikata, ITA – Standards Liaison, Department of Commerce

The panel will be formed by indicatively 4 experts: representatives from the European Commission, the European industry, the US government and the American industry

·         EC: Manuel Sanchez Jimenez, DG Transport and Energy

·         EU industry: Andrea Luxa, SIEMENS

·         US government: David Wollman, NIST

·         American industry: John Caskey, NEMA

15:00
Innovation: Smart meters
The EU and US will give an update on the standardization context in the field of smart meters and on ongoing and/or future activities.

·         EU: Daniel Hec, Marcogaz; European Standardization Organizations Smart Meters Coordination Group

·         US: John Caskey, NEMA

Expert panel discussion
Moderator:  David Boswarthick, ETSI Senior Technical Officer for TC M2M

The panel will be formed by indicatively representatives from the European Commission, the European industry, the US government and the American industry

·         EC: Manuel Sanchez Jimenez, DG Transport and Energy

·         EU industry: Marylin Arndt, ETSI TC M2M

·         US government: David Wollman, NIST

·         American industry: John Caskey, NEMA

16:00
Closing of the event